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Effect Of The Etching Regimes On The Memristor Properties Of Al2O3 Thin Layers.

Natalia V. RybinaNikolai B. Rybin
Published in: RADIOELEKTRONIKA (2020)
Keyphrases
  • theoretical framework
  • quantum mechanics
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  • case based reasoning
  • structural properties
  • multi layer
  • thin film
  • magnetic recording