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An AOI system development for inspecting defects on 6 surfaces of chips.

Ming-Fu ChenChih-Wen ChenChih-Yen ChenChi-Hung HwangLiang-Yin Hwang
Published in: I2MTC (2016)
Keyphrases
  • software engineering
  • rapid development
  • computer vision
  • database
  • real time
  • website
  • case study
  • mobile devices
  • high speed
  • decision support
  • knowledge based systems
  • information processing
  • development environment