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TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits.

Sung S.-Y. HsuehRyan H.-M. HuangCharles H.-P. Wen
Published in: ISQED (2014)
Keyphrases
  • error rate
  • statistical analysis
  • test set
  • misclassification rate
  • pattern recognition
  • multi class