Advances in machine learning and deep learning applications towards wafer map defect recognition and classification: a review.
Tongwha KimKamran BehdinanPublished in: J. Intell. Manuf. (2023)
Keyphrases
- deep learning
- unsupervised learning
- pattern recognition
- feature extraction
- support vector
- machine learning
- restricted boltzmann machine
- object recognition
- feature space
- text classification
- image classification
- unsupervised feature learning
- deep architectures
- feature set
- training set
- decision trees
- supervised learning
- training data
- data sets