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Gate-level current waveform simulation of CMOS integrated circuits.

Alessandro BoglioloLuca BeniniGiovanni De MicheliBruno Riccò
Published in: ISLPED (1996)
Keyphrases
  • integrated circuit
  • metal oxide semiconductor
  • high speed
  • simulation model
  • levels of abstraction
  • higher level
  • power consumption
  • neural network
  • image analysis
  • simulation environment
  • cmos technology
  • multiple input