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Automatic Waveform Recognition of Overlapping LPI Radar Signals Based on Multi-Instance Multi-Label Learning.
Zesi Pan
Shafei Wang
Mengtao Zhu
Yunjie Li
Published in:
IEEE Signal Process. Lett. (2020)
Keyphrases
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signal processing
multi instance multi label learning
pattern recognition
object recognition
frequency modulation
action recognition
image matching
fundamental frequency
feature extraction
semi supervised
model selection
maximum margin