EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification.
Andrew SternUlbert BoteroFahim RahmanDomenic ForteMark M. TehranipoorPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
- machine learning
- decision trees
- feature selection
- machine learning methods
- machine learning algorithms
- feature vectors
- support vector machine
- support vector
- training set
- feature extraction
- pattern recognition
- probabilistic model
- classification accuracy
- unsupervised learning
- machine learning approaches
- detection rate
- detection method
- information extraction
- preprocessing
- training data
- learning algorithm
- supervised machine learning
- classification scheme
- automatic classification
- false alarms
- bayesian framework
- video classification
- learning tasks
- classification method
- support vector machine svm
- expectation maximization
- text classification
- feature set
- text mining
- active learning