Login / Signup
Surface Layer Analysis of Si Sphere by XRF and XPS.
Lulu Zhang
Yasushi Azuma
Akira Kurokawa
Naoki Kuramoto
Kenichi Fujii
Published in:
IEEE Trans. Instrum. Meas. (2015)
Keyphrases
</>
data analysis
image analysis
database
databases
neural network
learning algorithm
computer vision
website
three dimensional
video sequences
object recognition
statistical analysis