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WAL-assisted Tiering: Painlessly Improving Your Favorite Log-Structured KV Store Instead of Building a New One.

Xubin ChenJingpeng HaoYifan QiaoTong Zhang
Published in: MEMSYS (2020)
Keyphrases
  • structured data
  • database
  • databases
  • database systems
  • support vector
  • mobile devices
  • data model
  • x ray
  • transmission line
  • log log