Login / Signup
A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge.
B. P. Yan
Y. F. Yang
C. C. Hsu
H. B. Lo
E. S. Yang
Published in:
Microelectron. Reliab. (2001)
Keyphrases
</>
search engine
neural network
learning algorithm
social networks
information systems
image processing
decision trees
bayesian networks
multiscale
cooperative
steady state
thin film