Compact Modeling of IGZO-based CAA-FETs with Time-zero-instability and BTI Impact on Device and Capacitor-less DRAM Retention Reliability.
Jingrui GuoYing SunLingfei WangXinlv DuanKailiang HuangZhaogui WangJunxiao FengQian ChenShijie HuangLihua XuDi GengGuangfan JiaoShihui YinZhengbo WangWeiliang JingLing LiMing LiuPublished in: VLSI Technology and Circuits (2022)