Characterisation method for chip card ESD events causing terminal failures.
Gerhard GroosPublished in: Microelectron. Reliab. (2012)
Keyphrases
- low cost
- data sets
- experimental evaluation
- prior knowledge
- mutual information
- high accuracy
- support vector machine svm
- optimization algorithm
- clustering method
- pairwise
- preprocessing
- objective function
- detection method
- support vector machine
- matching algorithm
- high precision
- temporal information
- event detection
- input image
- cost function
- significant improvement
- training data
- similarity measure
- image segmentation
- decision trees
- image processing