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Analysis and resolution of a thermally accelerated early life failure mechanism in a 40 V GaN FET.

Donald A. GajewskiRandall D. LewisBenjamin M. Decker
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • feature extraction
  • data structure
  • data analysis
  • image analysis
  • mathematical analysis
  • database
  • data sets
  • computer vision
  • multiscale
  • statistical analysis
  • gray level
  • infrared
  • quantitative analysis
  • daily life