Impact of RF stress on the low-frequency noise in nMOSFETs.
Haipeng FuMuqian NiuLiping YangXuguang LiKaixue MaPublished in: IEICE Electron. Express (2021)
Keyphrases
- low frequency
- high frequency
- frequency band
- frequency domain
- wavelet transform
- wavelet analysis
- subband
- discrete wavelet transform
- radio frequency
- electromagnetic fields
- high resolution
- low pass
- wavelet coefficients
- high frequency components
- relevance feedback
- original images
- multiresolution
- spatial domain
- image compression
- wavelet domain
- multiscale
- visual quality
- contourlet transform
- fusion rules
- image analysis