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Insulator Defect Recognition Based on Vision Big-Model Transfer Learning and Stochastic Configuration Network.

Siyuan LiuYihua MaZedong ZhengXinfu PangBingyou Li
Published in: IET Signal Process. (2024)
Keyphrases
  • transfer learning
  • probabilistic model
  • data sets
  • network structure
  • probability distribution
  • knowledge discovery
  • unsupervised learning
  • cross domain
  • databases
  • neural network
  • similarity measure
  • nearest neighbor