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A near-threshold 10T differential SRAM cell with high read and write margins for tri-gated FinFET technology.

Mitesh LimachiaRajesh Amratlal ThakkerNikhil Kothari
Published in: Integr. (2018)
Keyphrases
  • rapid development
  • read write
  • wide range
  • cost effective
  • case study
  • data processing
  • data sets
  • e learning
  • computer systems
  • key technologies