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Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124.

Yefim Haim MichlinLyubov MeshkovIrit Grunin
Published in: IEEE Trans. Reliab. (2008)
Keyphrases
  • multiple instance learning
  • control system
  • distributed systems
  • data sets
  • data mining
  • case study
  • multiscale
  • supervised learning
  • smart grid
  • sequential search