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Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis.
Hsien-Chin Chiu
Chao-Hung Chen
Hsuan-Ling Kao
Feng-Tso Chien
Ping-Kuo Weng
Yan-Tang Gau
Hao-Wei Chuang
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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low frequency
high frequency
frequency domain
subband
frequency band
electromagnetic fields
machine learning
image processing
image segmentation
color images
denoising
wavelet analysis
high pass