Fast Static Compaction Algorithms for Sequential Circuit Test Vectors.
Michael S. HsiaoElizabeth M. RudnickJanak H. PatelPublished in: IEEE Trans. Computers (1999)
Keyphrases
- learning algorithm
- data structure
- computational cost
- computational complexity
- significant improvement
- neural network
- times faster
- case study
- worst case
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- benchmark datasets
- recently developed
- vector space
- parallel algorithm
- orders of magnitude
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- optimization problems
- query processing
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