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Entwurf von Testarchitekturen für VLSI-Bausteine.

Manfred Gerner
Published in: GI Jahrestagung (2) (1988)
Keyphrases
  • vlsi design
  • signal processing
  • vlsi circuits
  • data mining
  • machine learning
  • high speed
  • single chip
  • databases
  • genetic algorithm
  • multiresolution
  • vlsi architecture
  • syntactic pattern recognition
  • chip design
  • gate array