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Measuring the Microwave Magnetic Permeability of Small Samples Using the Short-Circuit Transmission Line Method.

Antti VepsalainenKhattiya ChalapatGeorghe S. Paraoanu
Published in: IEEE Trans. Instrum. Meas. (2013)
Keyphrases
  • objective function
  • image processing
  • feature set
  • transmission line
  • small samples
  • artificial intelligence
  • expert systems
  • higher order
  • prediction model
  • highly accurate