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Influence of SiC epitaxial wafer quality on yield of 1.2kV SiC-DMOSFETs.
Junji Senzaki
Ryoji Kosugi
Keiko Masumoto
Takeshi Mitani
Takeharu Kuroiwa
Hiroshi Yamaguchi
Published in:
IRPS (2022)
Keyphrases
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high quality
machine learning
quality assessment
higher quality
thin film
artificial intelligence
decision making
database systems
data structure
evolutionary algorithm