VALIDITY MEASURES
Experts
- Yasunori Endo
- Yukihiro Hamasuna
- Sriparna Saha
- Ryo Ozaki
- Sanghamitra Bandyopadhyay
- David Pinto
- Hamid Parvin
- Shai Ben-David
- Peng Wen
- Sadaaki Miyamoto
- Yuridiana Alemán
- Samad Nejatian
- Jing Li
- Feng Liu
- Erzhou Zhu
- Çagatay Demiralp
- Jinglu Hu
- Pasi Fränti
- Nitish V. Thakor
- Mateus Fogaça
- Luca Coraggio
- Qifei Zhang
- Jianqiang Huang
- Eduardo R. Hruschka
- Joanne Leong
- Frank Klawonn
- Anna Cena
- Wai Lok Woo
- Yanjing Hu
- Shrinu Kushagra
- Amit Kumar
- Saman Riaz
- Musa Mojarad
- Liaojun Pang
- Darnes Vilariño
- Ricardo Reis
- Ali Arshad
- Rina Panigrahy
- Eva-Maria Grossauer
Venues
- CoRR
- Expert Syst. Appl.
- FUZZ-IEEE
- Pattern Recognit.
- IEEE Access
- Clust. Comput.
- Soft Comput.
- J. Adv. Comput. Intell. Intell. Informatics
- J. Intell. Fuzzy Syst.
- KES (1)
- Knowl. Based Syst.
- Inf. Sci.
- ICML
- ICNC
- EMBC
- CCGRID
- FSKD (1)
- Complex.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Bioinform.
- ICDM
- FSKD
- Neurocomputing
- J. Comput. Chem.
- ICCSA (1)
- IEEE Trans. Knowl. Data Eng.
- Eur. J. Oper. Res.
- ISD
- IEEE Trans. Neural Networks Learn. Syst.
- AAAI
- SMC
- Data
- ICCV
- PAKDD
- Biomed. Signal Process. Control.
- SCIS&ISIS
- IEEE Trans. Vis. Comput. Graph.
- IEEE Congress on Evolutionary Computation
- Entropy
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