VALIDITY MEASURES
Experts
- Yasunori Endo
- Ryo Ozaki
- Sriparna Saha
- Yukihiro Hamasuna
- Sanghamitra Bandyopadhyay
- Shai Ben-David
- Sadaaki Miyamoto
- Peng Wen
- Feng Liu
- Jing Li
- Erzhou Zhu
- Jinglu Hu
- Yuridiana Alemán
- Çagatay Demiralp
- Hamid Parvin
- David Pinto
- Samad Nejatian
- Aparna Murthy
- Liaojun Pang
- Musa Mojarad
- Qifei Zhang
- Andrew B. Kahng
- Anup Bhattacharya
- Pietro Coretto
- Yun Liang
- Taesung Park
- Xiaodong Liu
- Luca Coraggio
- Martin Bresler
- Michael Haller
- Huasong Zhong
- Florian Perteneder
- Chong Chen
- Saman Riaz
- Thomas Seidl
- Nir Ailon
- Vahideh Rezaie
- Hua Mao
- Frank Klawonn
Venues
- CoRR
- Expert Syst. Appl.
- FUZZ-IEEE
- Pattern Recognit.
- Soft Comput.
- Clust. Comput.
- IEEE Access
- J. Adv. Comput. Intell. Intell. Informatics
- Bioinform.
- Knowl. Based Syst.
- Complex.
- Neurocomputing
- Inf. Sci.
- ICDM
- IEEE Trans. Pattern Anal. Mach. Intell.
- FSKD
- J. Intell. Fuzzy Syst.
- ICNC
- CCGRID
- ICML
- KES (1)
- FSKD (1)
- EMBC
- Sensors
- IEEE Trans. Neural Networks Learn. Syst.
- SIGCSE
- Biomed. Signal Process. Control.
- J. Comput. Chem.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Vis. Comput. Graph.
- Eur. J. Oper. Res.
- CIDM
- ICSI (2)
- IEEE Trans. Fuzzy Syst.
- ISDA
- ICASSP
- IFSA-SCIS
- SCIS&ISIS
- SMC
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