TREC TEST COLLECTIONS
Experts
- Douglas W. Oard
- Ian Soboroff
- Joemon M. Jose
- Iadh Ounis
- Michael D. Ekstrand
- Ellen M. Voorhees
- Stewart Whiting
- Suzan Verberne
- Dirk Lewandowski
- Philippe Mulhem
- Dan Roth
- Xiao Wang
- Ji-Rong Wen
- Lorraine Goeuriot
- Kareem Darwish
- ChengXiang Zhai
- Krisztian Balog
- Kirk Roberts
- Nicola Tonellotto
- Jian-Yun Nie
- David A. Evans
- Gabriela González Sáez
- James Allan
- Graham McDonald
- Zhicheng Dou
- Mark Sanderson
- Petra Galuscáková
- Tetsuya Sakai
- Charles L. A. Clarke
- Rashmi Sankepally
- Asia J. Biega
- Brian D. Davison
- Isaac Johnson
- Chen Xing
- Julián Urbano
- Chenliang Li
- Jun Xu
- Fabio Crestani
- Ting Bai
Venues
- TREC
- CoRR
- SIGIR
- CIKM
- Inf. Process. Manag.
- ECIR
- J. Am. Soc. Inf. Sci.
- ICASSP
- CLEF
- ICTIR
- CLEF (Working Notes)
- FIRE
- ACM Trans. Inf. Syst.
- RIAO
- NTCIR
- ICML
- J. Assoc. Inf. Sci. Technol.
- AMIA
- IIR
- Inf. Retr.
- SIGIR Forum
- INEX
- IGARSS
- Neural Comput. Appl.
- AIRS
- EVIA@NTCIR
- IEEE Data Eng. Bull.
- IEEE Trans. Speech Audio Process.
- WMT@EMNLP
- IRAL
- ECCV (4)
- J. Inf. Sci.
- Eur. J. Oper. Res.
- Inf. Storage Retr.
- AI Open
- ICVGIP
- MICAI (1)
- WSDM
- ECIR (1)
Related Topics
Related Keywords
Popularity