SUPERVISED CLASSIFIERS
Experts
- Lorenzo Bruzzone
- Erik Cambria
- José Francisco Martínez Trinidad
- Aritz Pérez
- José Antonio Lozano
- Iñaki Inza
- Masashi Sugiyama
- Sebastiano B. Serpico
- Muhammad Zubair Asghar
- Jesús Ariel Carrasco-Ochoa
- Mineichi Kudo
- Gabriele Moser
- Engelbert Mephu Nguifo
- Seungryong Kim
- Milton García-Borroto
- Shakeel Ahmad
- Jiwon Kim
- Erion Çano
- Andrés Eduardo Gutiérrez-Rodríguez
- Kwangrok Ryoo
- Basilio Sierra
- Xianling Mao
- Heyan Huang
- Maurizio Morisio
- Daehwan Kim
- Begüm Demir
- Rogelio Salinas-Gutiérrez
- Pushpak Bhattacharyya
- Hansang Cho
- Man Lan
- Santiago Mazuelas
- Pierre Comon
- Dan Wang
- Andreas Dengel
- Gyuseong Lee
- Stéphane Girard
- Francisco Herrera
- Ali Amiryousefi
- Junyoung Seo
Venues
- CoRR
- IGARSS
- IEEE Access
- SemEval@NAACL-HLT
- Remote. Sens.
- Sensors
- IJCNN
- Pattern Recognit. Lett.
- IEEE Trans. Geosci. Remote. Sens.
- Inf. Process. Manag.
- SemEval@COLING
- Pattern Recognit.
- Int. J. Appl. Earth Obs. Geoinformation
- LREC
- Multim. Tools Appl.
- ICDM Workshops
- Inf. Sci.
- ICASSP
- ECIR
- Soc. Netw. Anal. Min.
- BMC Bioinform.
- SemEval@ACL
- CIKM
- NLDB
- MICAI (2)
- CIARP
- Expert Syst. Appl.
- J. Classif.
- CVPR
- IberLEF@SEPLN
- ICPR
- Soft Comput.
- Knowl. Based Syst.
- Environ. Model. Softw.
- INTERSPEECH
- ICMLA
- IEEE BigData
- Hum. centric Comput. Inf. Sci.
- Comput. Electr. Eng.
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