SUPERVISED CLASSIFIERS
Experts
- Erik Cambria
- Lorenzo Bruzzone
- José Francisco Martínez Trinidad
- Masashi Sugiyama
- José Antonio Lozano
- Aritz Pérez
- Iñaki Inza
- Pushpak Bhattacharyya
- Mineichi Kudo
- Xianling Mao
- Jiwon Kim
- Andrés Eduardo Gutiérrez-Rodríguez
- Sebastiano B. Serpico
- Basilio Sierra
- Hansang Cho
- Junyoung Seo
- Dan Wang
- Man Lan
- Ali Amiryousefi
- Milton García-Borroto
- Shakeel Ahmad
- Begüm Demir
- Jesús Ariel Carrasco-Ochoa
- Engelbert Mephu Nguifo
- Heyan Huang
- Andreas Dengel
- Gabriele Moser
- Pierre Comon
- Muhammad Zubair Asghar
- Santiago Mazuelas
- Erion Çano
- Stéphane Girard
- Daehwan Kim
- Rogelio Salinas-Gutiérrez
- Seungryong Kim
- Maurizio Morisio
- Gyuseong Lee
- Francisco Herrera
- Kwangrok Ryoo
Venues
- CoRR
- IGARSS
- IEEE Access
- SemEval@NAACL-HLT
- Remote. Sens.
- Pattern Recognit. Lett.
- Inf. Process. Manag.
- Sensors
- Inf. Sci.
- IEEE Trans. Geosci. Remote. Sens.
- IJCNN
- ICASSP
- SemEval@COLING
- Pattern Recognit.
- Multim. Tools Appl.
- LREC
- Expert Syst. Appl.
- Int. J. Appl. Earth Obs. Geoinformation
- Knowl. Based Syst.
- ICDM Workshops
- ECIR
- Soc. Netw. Anal. Min.
- IberLEF@SEPLN
- J. Classif.
- ICPR
- SemEval@ACL
- MICAI (2)
- CIARP
- Soft Comput.
- NLDB
- CVPR
- CIKM
- BMC Bioinform.
- IDA
- ICTAI
- KDIR
- ICML
- Neural Comput.
- Cogn. Comput.
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