SCANNED DOCUMENTS
Experts
- Chew Lim Tan
- C. V. Jawahar
- David S. Doermann
- Faisal Shafait
- Thomas M. Breuel
- Christian Reul
- Sekhar Mandal
- Mohamed Cheriet
- Frank Puppe
- P. Nagabhushan
- Syed Saqib Bukhari
- Marcus Liwicki
- Basilios Gatos
- Gaofeng Meng
- Bhabatosh Chanda
- Christoph Wick
- Rafael Dueire Lins
- Shijian Lu
- Gary E. Kopec
- Utpal Garain
- Shamik Sural
- Jun Sun
- Rolf Ingold
- Soumyadeep Dey
- Dimosthenis Karatzas
- Nam Ik Cho
- Dan S. Bloomberg
- Jean-Marc Ogier
- Santanu Chaudhury
- Chunhong Pan
- Ching Y. Suen
- Uwe Springmann
- Daniel P. Lopresti
- Umapada Pal
- B. B. Chaudhuri
- Venu Govindaraju
- Ricardo L. de Queiroz
- Nibaran Das
- Mohammed Javed
Venues
- CoRR
- ICDAR
- Int. J. Document Anal. Recognit.
- ICPR
- DRR
- Pattern Recognit.
- ICIP
- Document Analysis Systems
- IEEE Access
- Multim. Tools Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- CVPR
- Document Recognition
- ICASSP
- Sensors
- DAS
- Pattern Recognit. Lett.
- ICPR (2)
- J. Electronic Imaging
- Document Recognition and Retrieval
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Symposium on Document Engineering
- ICFHR
- MVA
- ACM Multimedia
- SAC
- DHd
- AAAI
- MOCR@ICDAR
- ICMV
- Pattern Anal. Appl.
- ICVGIP
- CVPR Workshops
- DocEng
- HIP@ICDAR
- ICCV
- ICPR (3)
- Image Vis. Comput.
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