SCANNED DOCUMENTS
Experts
- Chew Lim Tan
- David S. Doermann
- C. V. Jawahar
- Faisal Shafait
- Thomas M. Breuel
- Christian Reul
- Sekhar Mandal
- Syed Saqib Bukhari
- Mohamed Cheriet
- Frank Puppe
- P. Nagabhushan
- Gaofeng Meng
- Shijian Lu
- Marcus Liwicki
- Christoph Wick
- Rafael Dueire Lins
- Basilios Gatos
- Bhabatosh Chanda
- Rolf Ingold
- Shamik Sural
- Dimosthenis Karatzas
- Soumyadeep Dey
- Jun Sun
- Utpal Garain
- Gary E. Kopec
- Nam Ik Cho
- Ching Y. Suen
- Chunhong Pan
- Dan S. Bloomberg
- Uwe Springmann
- Santanu Chaudhury
- Jean-Marc Ogier
- S. P. Chowdhury
- Satoshi Naoi
- Xiaoqing Ding
- Daniel P. Lopresti
- Mohammed Javed
- B. B. Chaudhuri
- Andreas Dengel
Venues
- CoRR
- ICDAR
- Int. J. Document Anal. Recognit.
- ICPR
- DRR
- Pattern Recognit.
- ICIP
- Document Analysis Systems
- IEEE Access
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Document Recognition
- ICASSP
- Sensors
- DAS
- Pattern Recognit. Lett.
- Document Recognition and Retrieval
- J. Electronic Imaging
- ICPR (2)
- Int. J. Pattern Recognit. Artif. Intell.
- ICFHR
- ACM Symposium on Document Engineering
- ACM Multimedia
- MVA
- SAC
- AAAI
- MOCR@ICDAR
- Pattern Anal. Appl.
- DHd
- ICMV
- HIP@ICDAR
- DocEng
- ICPR (3)
- ICVGIP
- CVPR Workshops
- ICCV
- DAR@ICVGIP
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