SCAN STATISTIC
Experts
- Lajos Hanzo
- Xiang-Gen Xia
- Soon Xin Ng
- Hamid Jafarkhani
- Jean-Claude Belfiore
- Shinya Sugiura
- B. Sundar Rajan
- Georgios B. Giannakis
- Mohamed Oussama Damen
- Hsiao-feng Lu
- Osamah Alamri
- Tuomas Virtanen
- Camilla Hollanti
- Mohammed El-Hajjar
- Romain Serizel
- Robert Schober
- Genyuan Wang
- Sheng Chen
- Symeon Papadopoulos
- Rodrigo C. de Lamare
- Frédérique E. Oggier
- Arogyaswami Paulraj
- Jingon Joung
- P. Vijay Kumar
- Nicolas Turpault
- Chintha Tellambura
- Geert Leus
- Thien Huu Nguyen
- Babak Hassibi
- Are Hjørungnes
- Marvin K. Simon
- Yiannis Kompatsiaris
- Hongjun Xu
- G. Susinder Rajan
- Yindi Jing
- Roope Vehkalahti
- Hesham El Gamal
- Tjeng Thiang Tjhung
- Chao Xu
Venues
- CoRR
- ICASSP
- ICC
- GLOBECOM
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Commun.
- IEEE Trans. Inf. Theory
- IEEE Access
- PIMRC
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- IEEE Trans. Veh. Technol.
- IEEE Commun. Lett.
- ISIT
- IEEE Trans. Signal Process.
- Sensors
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- Int. J. Geogr. Inf. Sci.
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- Wirel. Pers. Commun.
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- TRECVID
- Signal Process.
- ITW
- IET Commun.
- IGARSS
- J. Comput. Phys.
- ICASSP (4)
- MediaEval
- Symmetry
- EMBC
- Multim. Tools Appl.
- EURASIP J. Adv. Signal Process.
- ACM Multimedia
- IEEE Trans. Aerosp. Electron. Syst.
- ISPRS Int. J. Geo Inf.
- SIAM J. Sci. Comput.
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