SCAN STATISTIC
Experts
- Lajos Hanzo
- Xiang-Gen Xia
- Soon Xin Ng
- Hamid Jafarkhani
- Jean-Claude Belfiore
- B. Sundar Rajan
- Shinya Sugiura
- Georgios B. Giannakis
- Hsiao-feng Lu
- Osamah Alamri
- Mohamed Oussama Damen
- Camilla Hollanti
- Romain Serizel
- Mohammed El-Hajjar
- Tuomas Virtanen
- Sheng Chen
- Genyuan Wang
- Robert Schober
- Symeon Papadopoulos
- Frédérique E. Oggier
- Arogyaswami Paulraj
- Jingon Joung
- Rodrigo C. de Lamare
- Nicolas Turpault
- P. Vijay Kumar
- Geert Leus
- Chintha Tellambura
- Are Hjørungnes
- Thien Huu Nguyen
- Babak Hassibi
- Marvin K. Simon
- Hesham El Gamal
- G. Susinder Rajan
- Chadi Abou-Rjeily
- Chao Xu
- Roope Vehkalahti
- Yiannis Kompatsiaris
- Hongjun Xu
- Tjeng Thiang Tjhung
Venues
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- IEEE Trans. Commun.
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- Multim. Tools Appl.
- EURASIP J. Adv. Signal Process.
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- ACM Multimedia
- IEEE Trans. Aerosp. Electron. Syst.
- ISWCS
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