SALIENCY MEASURE
Experts
- Zhi Liu
- Maria Montanucci
- Alexandre Rok
- Bartosz Walczak
- T. D. Alter
- Massimo Giulietti
- Ronen Basri
- Giovanni Zini
- Linwei Ye
- Wei Zhang
- Roy Gelbard
- Young-Jung Yu
- Tat-Jen Cham
- Subhayan Mukherjee
- Kohei Suenaga
- Jeffrey Mark Siskind
- C. Alejandro Párraga
- Jae-Young Sim
- Seong-Ho Park
- Byeong-Ju Han
- Michael Dorr
- Shidong Ke
- Liquan Shen
- Wolfgang Maass
- MarÃa Vanrell
- Lili Wang
- Shigeo Takahashi
- Lorenzo Baraldi
- Zhenbin Zhang
- Naihong Guo
- Anup Basu
- Gunther Heidemann
- Giuseppe Serra
- Gerald Fritz
- Seungjoon Yang
- Wenhai Xu
- Atsushi Kikuchi
- Zhaolin Su
- Shuhuan Zhao
Venues
- Finite Fields Their Appl.
- CoRR
- ICCV
- CVPR
- IEEE Signal Process. Lett.
- MVA
- VISAPP (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- Electron. Colloquium Comput. Complex.
- CVPR Workshops
- NIPS
- IEEE Access
- WAPCV
- IC-AI
- SoCG
- ICIMCS
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Image Process.
- Signal Process. Image Commun.
- ICPR
- MUE
- J. Approx. Theory
- Multim. Tools Appl.
- Ubiquity
- IEEE Trans. Broadcast.
- J. Electronic Imaging
- IICAI
- APSIPA
- ECCV (1)
- VISIGRAPP (4: VISAPP)
- ICCV Workshops
- ECCV (2)
- ICCVE
- CAD/Graphics
- Neurocomputing
- ICPR (4)
- J. Inform. and Commun. Convergence Engineering
- Comput. Vis. Image Underst.
- Expert Syst. J. Knowl. Eng.
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