SALIENCY MEASURE
Experts
- Alexandre Rok
- T. D. Alter
- Giovanni Zini
- Bartosz Walczak
- Maria Montanucci
- Linwei Ye
- Massimo Giulietti
- Zhi Liu
- Ronen Basri
- Rita Cucchiara
- Eunpil Park
- Gábor Korchmáros
- Christin Seifert
- Hayato Teranaka
- Kotaro Uchida
- Ju Liu
- Seungjoon Yang
- Lucas Paletta
- Amir Tamrakar
- Nuno Vasconcelos
- Joo Kooi Tan
- Kwanyong Lee
- Amnon Shashua
- Yuanyuan Wang
- Giuseppe Serra
- María Vanrell
- Xavier Otazu
- Jiangchuan Xie
- Aimin Hao
- Wei-Gang Chen
- Pavel Zid
- Michal Haindl
- Lili Wang
- Youqiang Hou
- Wei Zhang
- Junhao Li
- Lina Li
- Zheng-ping Hu
- Yonghuai Liu
Venues
- Finite Fields Their Appl.
- CoRR
- MVA
- IEEE Signal Process. Lett.
- ICCV
- VISAPP (2)
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CAD/Graphics
- J. Approx. Theory
- Expert Syst. J. Knowl. Eng.
- IICAI
- ICIMCS
- ICPR (4)
- Signal Process. Image Commun.
- Ubiquity
- J. Inform. and Commun. Convergence Engineering
- ICPR
- J. Electronic Imaging
- Discret. Comput. Geom.
- Multim. Tools Appl.
- Comput. Vis. Image Underst.
- SoCG
- IEEE Access
- VISIGRAPP (4: VISAPP)
- IEEE Trans. Broadcast.
- Electron. Colloquium Comput. Complex.
- WAPCV
- ECCV (1)
- Image Vis. Comput.
- ICCVE
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Comput. Vis.
- ECCV (2)
- ICCV Workshops
- APSIPA
- Neurocomputing
- IC-AI
- MUE
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