SALIENCY MEASURE
Experts
- Bartosz Walczak
- Maria Montanucci
- Ronen Basri
- Zhi Liu
- Linwei Ye
- Alexandre Rok
- Giovanni Zini
- Massimo Giulietti
- T. D. Alter
- Hong Qin
- Naila Murray
- Mikhail Startsev
- Young-Jung Yu
- Masaki Waga
- Naihong Guo
- Amnon Shashua
- Rugang Wang
- Paul L. Rosin
- Hans Burkhardt
- Zhaolin Su
- Wenhai Xu
- Ju Liu
- Ge Li
- Yaobin Zou
- Alexander Berengolts
- Thomas Sikora
- Donghyun Kim
- Horst Bischof
- Gerald Fritz
- Yuanyuan Wang
- Shimon Ullman
- Christin Seifert
- Wei Zhang
- Ho Joon Kim
- Yun-Seok Cho
- Robert Legenstein
- Yonghuai Liu
- Shuhuan Zhao
- Liquan Shen
Venues
- Finite Fields Their Appl.
- CoRR
- ICCV
- IEEE Signal Process. Lett.
- MVA
- VISAPP (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- ICPR
- IEEE Trans. Broadcast.
- ICIMCS
- NIPS
- ECCV (1)
- IEEE Access
- Electron. Colloquium Comput. Complex.
- Expert Syst. J. Knowl. Eng.
- Multim. Tools Appl.
- WAPCV
- VISIGRAPP (4: VISAPP)
- Discret. Comput. Geom.
- J. Inform. and Commun. Convergence Engineering
- Ubiquity
- Neurocomputing
- IICAI
- APSIPA
- ECCV (2)
- MUE
- ICCV Workshops
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Vis. Image Underst.
- ICPR (4)
- Image Vis. Comput.
- ICCVE
- IEEE Trans. Image Process.
- IC-AI
- J. Electronic Imaging
- J. Approx. Theory
- SoCG
- Int. J. Comput. Vis.
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