PROBE IMAGE
Experts
- Shiguang Shan
- Wen Gao
- Nasser M. Nasrabadi
- Zhen Lei
- Soma Biswas
- Josef Kittler
- Xilin Chen
- Stan Z. Li
- Kieron Messer
- Mita Nasipuri
- Debotosh Bhattacharjee
- Christian Herrmann
- Rama Chellappa
- Vishal M. Patel
- Sobhan Soleymani
- Weihong Deng
- P. Jonathon Phillips
- Heydi Méndez-Vázquez
- Chu-Song Chen
- Haoyi Xiong
- Shiming Ge
- Shengwei Zhao
- Qingzhong Wang
- Andrew Zisserman
- Jürgen Beyerer
- Sivaram Prasad Mudunuri
- Xiaohua Xie
- Jeremy M. Dawson
- Zhen Tang
- Laiyun Qing
- Pong C. Yuen
- Aysegul Dundar
- Zhiyi Cheng
- Shuowen Hu
- Jiansheng Chen
- Yong Liu
- Siyu Huang
- Andrew Tao
- Shengcai Liao
Venues
- CoRR
- ICPR
- ICB
- FG
- IEEE Access
- Pattern Recognit. Lett.
- Sensors
- Neurocomputing
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- Signal Process.
- ACM Multimedia
- IEEE Trans. Inf. Forensics Secur.
- IJCB
- CVPR
- CVPR Workshops
- IEEE Trans. Instrum. Meas.
- Neural Networks
- PCM
- FGR
- AVSS
- IEEE Signal Process. Lett.
- ICCV
- IEEE Trans. Syst. Man Cybern. Part B
- IEEE Trans. Image Process.
- Int. J. Pattern Recognit. Artif. Intell.
- Pattern Recognit.
- Int. J. Comput. Vis.
- CW
- J. Vis. Commun. Image Represent.
- J. Electronic Imaging
- Int. J. Bifurc. Chaos
- BigMM
- CAD/Graphics
- IEEE Trans. Consumer Electron.
- Vis. Comput.
- BIOSIG
- ASSETS
- IEEE Trans. Biom. Behav. Identity Sci.
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