PROBE IMAGE
Experts
- Shiguang Shan
- Wen Gao
- Nasser M. Nasrabadi
- Zhen Lei
- Debotosh Bhattacharjee
- Kieron Messer
- Mita Nasipuri
- Xilin Chen
- Stan Z. Li
- Josef Kittler
- Soma Biswas
- Jeremy M. Dawson
- Xiaohua Xie
- Sivaram Prasad Mudunuri
- Qingzhong Wang
- Andrew Zisserman
- Jürgen Beyerer
- Shengwei Zhao
- Chu-Song Chen
- Shiming Ge
- Haoyi Xiong
- Sobhan Soleymani
- Vishal M. Patel
- P. Jonathon Phillips
- Weihong Deng
- Heydi Méndez-Vázquez
- Christian Herrmann
- Rama Chellappa
- Sumit Shekhar
- Mahantapas Kundu
- Chia-Ping Chen
- Yen-Wei Chen
- Bihan Wen
- Hao Chen
- Hazim Kemal Ekenel
- Kevin J. Shih
- Stefan Hörmann
- Q. M. Jonathan Wu
- Hossein Kashiani
Venues
- CoRR
- ICPR
- ICB
- FG
- Pattern Recognit. Lett.
- IEEE Access
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- Neurocomputing
- IEEE Trans. Inf. Forensics Secur.
- CVPR
- CVPR Workshops
- IJCB
- Signal Process.
- ACM Multimedia
- IEEE Trans. Syst. Man Cybern. Part B
- IEEE Trans. Image Process.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Electronic Imaging
- Int. J. Bifurc. Chaos
- Pattern Recognit.
- CW
- Int. J. Comput. Vis.
- J. Vis. Commun. Image Represent.
- Neural Networks
- IEEE Trans. Instrum. Meas.
- PCM
- IEEE Signal Process. Lett.
- FGR
- AVSS
- ICCV
- Signal Process. Image Commun.
- VISAPP (1)
- IEEE Trans. Circuits Syst. Video Technol.
- IPCV
- ICASSP
- Image Vis. Comput.
- ACCV (3)
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