ORDINAL MEASURES
Experts
- Zhenan Sun
- Tieniu Tan
- Dinkar N. Bhat
- Shree K. Nayar
- Patrick J. Flynn
- Ran He
- Vahid Mirjalili
- Mateusz Trokielewicz
- Yang Hu
- Xihui Liu
- Sudipta Banerjee
- Adam Czajka
- Yixing Lao
- Daniel Moreira
- Konstantinos Sirlantzis
- Arun Ross
- Gareth Howells
- Hengshuang Zhao
- Kevin W. Bowyer
- James F. Peters
- Zhenhua Chai
- Xiaogang Xu
- Zhipeng Cai
- Xingyu Gao
- Chiara Galdi
- Luis Galarza
- Soumyadip Rakshit
- Eduardo Garea Llano
- Xianquan Zhang
- Stefan Scherer
- Yung-hui Li
- Joseph L. Mundy
- Philip J. Morrow
- Dominick J. LoIacono
- Ajay Kumar
- Robert Laronga
- Benjamin Hell
- Dong Liang
- Annette Morales-González
Venues
- CoRR
- CVPR
- IEEE Trans. Inf. Forensics Secur.
- ICIP
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Multimedia
- BTAS
- Int. J. Bio Inspired Comput.
- ICPR
- ISCSCT (2)
- ISBA
- Secur. Commun. Networks
- WACV
- CIB
- ICB
- ICASSP
- ECCV Workshop BioAW
- ICIP (2)
- CCBR
- ICPR (3)
- ICCV
- Proc. IEEE
- ECCV (3)
- BMVC
- Applications of Invariance in Computer Vision
- IEEE Trans. Circuits Syst. Video Technol.
- Pattern Recognit.
- NeurIPS
- CAIP
- CIARP
- 3DPVT
- SCG
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