NOISY PIXELS
Experts
- Etienne E. Kerre
- Stefan Schulte
- Mike Nachtegael
- Hong Ren Wu
- Ayyaz Hussain
- Valérie De Witte
- Dietrich Van der Weken
- Vladimir S. Crnojevic
- Samuel Morillas
- Francisco J. Gallegos Funes
- Vladimir V. Lukin
- M. Emin Yüksel
- Sohail Masood Bhatti
- Bin Qiu
- Mila Nikolova
- M. Arfan Jaffar
- Farokh Marvasti
- Hossein Hosseini
- Tom Mélange
- ValentÃn Gregori
- Igor Djurovic
- Tae-Sun Choi
- Om Prakash Verma
- Awadhesh Kumar Singh
- Yinwei Zhan
- Ming Yan
- Raghav Dev
- Jiayi Chen
- Jaakko Astola
- Grace Oletu
- Umesh Ghanekar
- Masahiro Iwahashi
- Vaibhav Shrotriya
- A. J. Han Vinck
- Hitoshi Kiya
- Noriaki Suetake
- Ping Guo
- Yong-Hong Tan
- Sos S. Agaian
Venues
- IEEE Signal Process. Lett.
- Multim. Tools Appl.
- Signal Image Video Process.
- IEEE Trans. Image Process.
- CoRR
- Signal Process.
- ICASSP
- IET Image Process.
- IEEE Trans. Commun.
- IEEE Access
- FUZZ-IEEE
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- ICIP (1)
- EURASIP J. Image Video Process.
- EURASIP J. Adv. Signal Process.
- PIMRC
- EUSIPCO
- ISCAS
- SIAM J. Imaging Sci.
- ACIVS
- Real Time Imaging
- J. Electronic Imaging
- ICECS
- Sensors
- J. Vis. Commun. Image Represent.
- Expert Syst. Appl.
- ICASSP (4)
- Digital Photography
- ISIT
- Neurocomputing
- Fuzzy Sets Syst.
- ICIP
- SIGMAP
- IJCNN
- ICIP (3)
- MIKE
- J. Comput. Sci.
- Comput. Graph. Forum
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