MEASURING SIMILARITY
Experts
- José C. Príncipe
- Elena Garces
- Maria Rifqi
- Bernadette Bouchon-Meunier
- Diego Gutierrez
- Yusu Wang
- Belén Masiá
- Hao Hu
- Haixun Wang
- Jian-Wu Xu
- Irwin King
- C. J. Rose
- Hongyuan Zhu
- Alessandro Lenci
- Giovanni Quattrone
- Puligadda Veereswara Kumar
- Li-Heng Liou
- Hossein Kamalzadeh
- Hua Duan
- Vangipuram Radhakrishna
- Chanchala Kaddi
- Jan Modersitzki
- Bijan Parsia
- Sang-Wook Kim
- Yiwei Zhang
- Dongjin Kim
- Abhinav Atrishi
- Nikita Povarov
- Dmitrij V. Koznov
- Zenglin Xu
- Toshihiko Yamasaki
- Emilio Ferrara
- Manuel Lagunas
- Mehdi Afshari
- Pankoo Kim
- Roman Vasiliev
- Zhenying He
- Mohammad Rezaei
- Duan-Shin Lee
Venues
- CoRR
- IEEE Access
- J. Intell. Fuzzy Syst.
- Expert Syst. Appl.
- IEEE Trans. Knowl. Data Eng.
- Pattern Recognit. Lett.
- Inf. Sci.
- APWeb
- BMC Bioinform.
- J. Cheminformatics
- SIGIR
- FUZZ-IEEE
- Knowl. Inf. Syst.
- Web Intelligence
- Neurocomputing
- FSKD
- ICCBR
- WBIR
- EKAW
- Scientometrics
- CIKM
- ICIC (3)
- PAKDD
- J. Assoc. Inf. Sci. Technol.
- ISI
- Multim. Syst.
- IDEAL
- GrC
- SAC
- Knowl. Based Syst.
- ICPR (3)
- ACM Trans. Graph.
- WAIM
- Australian Conference on Artificial Intelligence
- J. Comput. Sci. Technol.
- Intell. Data Anal.
- ICIP
- IJCNN
- Image Vis. Comput.
Related Topics
Related Keywords
Popularity