MEASURING SIMILARITY
Experts
- Maria Rifqi
- Diego Gutierrez
- José C. Príncipe
- Yusu Wang
- Elena Garces
- Bernadette Bouchon-Meunier
- Bijan Parsia
- Hua Duan
- Zhenjiang Lin
- Fuqing Duan
- Sven Helmer
- Hamid R. Tizhoosh
- Haixun Wang
- Chia-Tai Chang
- Chanchala Kaddi
- Nikita Povarov
- Vinjamuri Janaki
- Yihuan Zhang
- Abdelkader Belkhir
- Chien-Hsing Chen
- Yoshiaki Sakai
- Emilio Ferrara
- Tahani Alsubait
- Gholamreza Hesamian
- Jian-Wu Xu
- Licia Capra
- Dongjin Kim
- Chung-Chian Hsu
- Hien T. Nguyen
- Seok Bin Son
- Puligadda Veereswara Kumar
- Minkyu Park
- Jung-Yi Jiang
- R. Venkatesh Babu
- Ana Serrano
- Cristian Bologa
- Honghui Xu
- Alessandro Lenci
- Mingxi Zhang
Venues
- CoRR
- IEEE Access
- J. Intell. Fuzzy Syst.
- Expert Syst. Appl.
- Pattern Recognit. Lett.
- IEEE Trans. Knowl. Data Eng.
- Inf. Sci.
- Web Intelligence
- FUZZ-IEEE
- Neurocomputing
- Knowl. Inf. Syst.
- J. Cheminformatics
- FSKD
- BMC Bioinform.
- APWeb
- SIGIR
- CIKM
- Multim. Syst.
- ICIP
- Knowl. Based Syst.
- J. Assoc. Inf. Sci. Technol.
- J. Comput. Sci. Technol.
- ACM Trans. Graph.
- Intell. Data Anal.
- IJCNN
- WBIR
- ICCBR
- IDEAL
- ICIC (3)
- SEKE
- EKAW
- IEEE Trans. Fuzzy Syst.
- GrC
- PAKDD
- SAC
- Multim. Tools Appl.
- ICMLA
- WAIM
- Image Vis. Comput.
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