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Experts
- Adam Czajka
- Kevin W. Bowyer
- Zhenan Sun
- Tieniu Tan
- Mateusz Trokielewicz
- Patrick J. Flynn
- Piotr Maciejewicz
- Hugo Proença
- Andreas Uhl
- John Daugman
- Banshidhar Majhi
- Hunny Mehrotra
- Nicolaie Popescu-Bodorin
- Yunhong Wang
- Lihu Xiao
- Soumyadip Rakshit
- Daniel Moreira
- Donald M. Monro
- Kaushik Roy
- Stephanie Schuckers
- Eduardo José da S. Luz
- Prabir Bhattacharya
- Bernadette Dorizzi
- David Menotti
- Michele Nappi
- Christoph Busch
- Arun Ross
- Richa Singh
- James R. Matey
- Fernando Alonso-Fernandez
- Mayank Vatsa
- Konstantinos Sirlantzis
- Joseph Thompson
- Man Zhang
- Kai Yang
- Valentina Emilia Balas
- Ritesh Vyas
- Nadia Othman
- Stefano Ricciardi
Venues
- CoRR
- BTAS
- ICB
- ICPR
- IEEE Trans. Inf. Forensics Secur.
- Pattern Recognit.
- ICIP
- Pattern Recognit. Lett.
- Image Vis. Comput.
- Multim. Tools Appl.
- BIOSIG
- WACV
- IET Biom.
- CVPR Workshops
- CCBR
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- J. Electronic Imaging
- SIU
- ICPR (4)
- EUSIPCO
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- IEEE Trans. Pattern Anal. Mach. Intell.
- IWBF
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- ICWET
- IEEE Trans. Syst. Man Cybern. Part B
- Proc. IEEE
- IJCB
- SINOBIOMETRICS
- EURASIP J. Adv. Signal Process.
- Appl. Intell.
- ISVC (1)
- IEEE Access
- IEEE Trans. Image Process.
- Comput. Vis. Image Underst.
- AVBPA
- ISNN (2)
- IIH-MSP
- ICBA
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