IRIS TEXTURE
Experts
- Adam Czajka
- Kevin W. Bowyer
- Mateusz Trokielewicz
- Zhenan Sun
- Arun Ross
- Andreas Uhl
- Piotr Maciejewicz
- Patrick J. Flynn
- Tieniu Tan
- Hugo Proença
- Prabir Bhattacharya
- Kaushik Roy
- Kang Ryoung Park
- Nicolaie Popescu-Bodorin
- Mayank Vatsa
- Richa Singh
- Christian Rathgeb
- Zhaofeng He
- Jaihie Kim
- Daniel Moreira
- John Daugman
- Konstantinos Sirlantzis
- Fernando Alonso-Fernandez
- Gareth Howells
- Bernadette Dorizzi
- Mahmut Karakaya
- Jing Liu
- Wen-Shiung Chen
- Byungjun Son
- James R. Matey
- Peter Wild
- Banshidhar Majhi
- Christoph Busch
- Richard P. Wildes
- Donald M. Monro
- Andrey Kuehlkamp
- Sonia Garcia-Salicetti
- Luis E. Garza-Castañón
- Byung Jun Kang
Venues
- CoRR
- ICB
- BTAS
- IEEE Trans. Inf. Forensics Secur.
- Pattern Recognit. Lett.
- IJCB
- ICIP
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- IEEE Access
- Pattern Recognit.
- WACV
- CCBR
- BIOSIG
- J. Electronic Imaging
- IEEE Trans. Syst. Man Cybern. Part B
- CVPR Workshops
- Scand. J. Inf. Syst.
- Multim. Tools Appl.
- ICPR (4)
- CIB
- ACPR
- AVBPA
- Comput. Vis. Image Underst.
- Expert Syst. Appl.
- BIOSIGNALS
- ISBA
- CIARP
- IWBF
- IET Biom.
- Int. J. Pattern Recognit. Artif. Intell.
- Int. J. Biom.
- EUSIPCO
- Pattern Anal. Appl.
- SIU
- PReMI
- SBSI
- Sensors
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