IRIS BIOMETRICS
Experts
- Christoph Busch
- Kevin W. Bowyer
- Adam Czajka
- Zhenan Sun
- Tieniu Tan
- Andreas Uhl
- Arun Ross
- Mateusz Trokielewicz
- Hugo Proença
- Fernando Alonso-Fernandez
- Kiran B. Raja
- Christian Rathgeb
- Patrick J. Flynn
- Josef Bigün
- Ramachandra Raghavendra
- Mayank Vatsa
- Piotr Maciejewicz
- Richa Singh
- Kang Ryoung Park
- Juan E. Tapia
- Banshidhar Majhi
- Kaushik Roy
- Ajay Kumar
- Prabir Bhattacharya
- Michele Nappi
- Hunny Mehrotra
- Bernadette Dorizzi
- Marios Savvides
- Mahmut Karakaya
- Zhaofeng He
- Damon L. Woodard
- David Menotti
- Julian Fiérrez
- Peter Wild
- Kien Nguyen Thanh
- Naser Damer
- Phalguni Gupta
- Vinod Chandran
- Daniel Riccio
Venues
- CoRR
- ICB
- IEEE Trans. Inf. Forensics Secur.
- BTAS
- Pattern Recognit. Lett.
- ICPR
- ICIP
- IJCB
- Multim. Tools Appl.
- CVPR Workshops
- IEEE Access
- BIOSIG
- Int. J. Biom.
- Image Vis. Comput.
- Pattern Recognit.
- IET Biom.
- EUSIPCO
- CCBR
- IWBF
- Sensors
- WACV
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- J. Electronic Imaging
- Comput. Vis. Image Underst.
- BIOSIGNALS
- SITIS
- AVBPA
- Scand. J. Inf. Syst.
- Comput. Secur.
- Signal Image Video Process.
- CIBIM
- CIB
- ISBA
- ICDP
- Pattern Anal. Appl.
- CIARP
- ACPR
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