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Experts
- Yunhong Wang
- Xiaoming Liu
- Stan Z. Li
- Edwin R. Hancock
- Juan E. Tapia
- William A. P. Smith
- Shiguang Shan
- Jing Wu
- Christoph Busch
- Bao-Liang Lu
- Richa Singh
- Mayank Vatsa
- Hazim Kemal Ekenel
- Mario Vento
- Modesto Castrillón Santana
- Antonio Greco
- Dacheng Tao
- Xilin Chen
- Thomas S. Huang
- Ramón Alberto Mollineda
- Marina L. Gavrilova
- Rong Jin
- Hemant A. Patil
- Gerhard Rigoll
- Cuixian Chen
- Qijun Zhao
- Dimitris N. Metaxas
- Steven C. H. Hoi
- Zhen Lei
- Haizhou Ai
- Serestina Viriri
- Noriko Nagata
- Lizhuang Ma
- Guodong Guo
- Alessia Saggese
- Yasmina Andreu
- George Azzopardi
- Karl Ricanek
- Yoshio Iwai
Venues
- CoRR
- IEEE Access
- Multim. Tools Appl.
- ICPR
- ICIP
- ICASSP
- FG
- Pattern Recognit.
- Pattern Recognit. Lett.
- Neurocomputing
- CVPR Workshops
- INTERSPEECH
- CVPR
- Image Vis. Comput.
- SMC
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- EMBC
- BMVC
- IJCNN
- SIU
- ICB
- CCBR
- IJCB
- J. Electronic Imaging
- Expert Syst. Appl.
- WACV
- CIARP
- IET Biom.
- FGR
- Biomed. Signal Process. Control.
- Neural Comput. Appl.
- IEEE Trans. Image Process.
- ICCV
- ICME
- ICCV Workshops
- ACM Multimedia
- IEEE Trans. Inf. Forensics Secur.
- Pattern Anal. Appl.
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