FACIAL APPEARANCE
Experts
- Marios Savvides
- Khoa Luu
- Shuicheng Yan
- Anil K. Jain
- Shigeo Morishima
- Akinobu Maejima
- Kevin W. Bowyer
- Sébastien Marcel
- Christoph Busch
- Xiangbo Shu
- Gee-Sern Hsu
- Hanjiang Lai
- Shiguang Shan
- Chi Nhan Duong
- Rama Chellappa
- Yong Man Ro
- Wen Gao
- Isao Echizen
- Amrutha Sethuram
- Eric Patterson
- Junichi Yamagishi
- Karl Ricanek
- Patrick J. Flynn
- Huy H. Nguyen
- Kha Gia Quach
- Nasser M. Nasrabadi
- Debayan Deb
- Jaime Gateno
- Xiaohua Xie
- Debotosh Bhattacharjee
- Luis Baumela
- Prem Natarajan
- Maja Pantic
- José Miguel Buenaposada
- Daeseung Kim
- T. Hoang Ngan Le
- Mita Nasipuri
- James J. Xia
- Michael A. K. Liebschner
Venues
- CoRR
- ICIP
- FG
- CVPR
- ICPR
- ICCV
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICASSP
- IJCB
- CVPR Workshops
- BTAS
- WACV
- IEEE Trans. Pattern Anal. Mach. Intell.
- SMC
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Affect. Comput.
- NeuroImage
- IEEE Trans. Syst. Man Cybern. Part B
- Expert Syst. Appl.
- IEEE Access
- ACM Multimedia
- SIGGRAPH Posters
- Neurocomputing
- IJCNN
- Int. J. Biom.
- ICCV Workshops
- IPCV
- IEEE Trans. Image Process.
- VISAPP (2)
- Sensors
- ICB
- IEICE Trans. Inf. Syst.
- IEEE Trans. Multim.
- ICME
- FGR
- BMVC
- ICMI
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