EDGE LOCALIZATION
Experts
- J. Andrew Bangham
- Rachid Deriche
- Bernard De Baets
- Carlos Lopez-Molina
- Luc Florack
- Josef Kittler
- Richard W. Harvey
- Olivier Monga
- Alison Bosson
- Humberto Bustince Sola
- Grégoire Malandain
- Jean Pierre Cocquerez
- Djemel Ziou
- Muhittin Gökmen
- Baptiste Magnier
- K. Paler
- Mario Coutino
- Yi Lu
- Philippe Montesinos
- T. Hoang Ngan Le
- Mubarak Shah
- Robert M. Haralick
- Chin-Chen Chang
- James J. Clark
- Arjan Kuijper
- John Illingworth
- Ramesh C. Jain
- Anil K. Jain
- Stephen J. Sangwine
- Mads Nielsen
- Haruko Okamura
- Salvatore Tabbone
- Qian-Ru Wei
- Michel Chapron
- Augusto Sarti
- Martin Simonovsky
- Donna J. Williams
- Yu-Li You
- Ramakrishna Kakarala
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- J. Math. Imaging Vis.
- Pattern Recognit.
- Pattern Recognit. Lett.
- EUSIPCO
- Image Vis. Comput.
- Discret. Math.
- CVPR
- IGARSS
- Electron. J. Comb.
- BMVC
- IEEE Geosci. Remote. Sens. Lett.
- ACIVS
- Comput. Vis. Image Underst.
- ICIP
- ICASSP
- VCIP
- ICPR (1)
- Scale-Space
- IEEE Access
- ICIP (3)
- MECO
- ICPR (3)
- Biomed. Signal Process. Control.
- J. Electronic Imaging
- ICIAP
- Int. J. Pattern Recognit. Artif. Intell.
- J. Multiple Valued Log. Soft Comput.
- Multim. Tools Appl.
- J. Graph Theory
- ECCV (1)
- Ars Comb.
- ICPR (2)
- ICIP (1)
- ICPR
- Int. J. Comput. Vis.
- SMC
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