EDGE LOCALIZATION
Experts
- J. Andrew Bangham
- Rachid Deriche
- Bernard De Baets
- Luc Florack
- Richard W. Harvey
- Carlos Lopez-Molina
- Josef Kittler
- Grégoire Malandain
- Olivier Monga
- Humberto Bustince Sola
- Alison Bosson
- Djemel Ziou
- Jean Pierre Cocquerez
- Muhittin Gökmen
- Arjan Kuijper
- Lucas J. van Vliet
- Philippe Montesinos
- Mads Nielsen
- Michel Chapron
- Stefano Tubaro
- Mubarak Shah
- Wenhua Ma
- Yu-Li You
- Chin-Chen Chang
- Martin Simonovsky
- Salvatore Tabbone
- Piet W. Verbeek
- K. Paler
- Ramesh C. Jain
- Andrew Knyazev
- John Illingworth
- Mario Coutino
- Haruko Okamura
- Mikel Galar
- Yi Lu
- Baptiste Magnier
- Alfred O. Hero III
- Donna J. Williams
- Mostafa Kaveh
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit.
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- Image Vis. Comput.
- IGARSS
- EUSIPCO
- CVPR
- Comput. Vis. Image Underst.
- ICIP
- IEEE Geosci. Remote. Sens. Lett.
- ACIVS
- BMVC
- Discret. Math.
- ICPR (1)
- ICASSP
- VCIP
- Electron. J. Comb.
- J. Multiple Valued Log. Soft Comput.
- Ars Comb.
- ICIP (3)
- ECCV (1)
- Int. J. Pattern Recognit. Artif. Intell.
- Multim. Tools Appl.
- IEEE Access
- ICPR (3)
- ICIAP
- J. Electronic Imaging
- J. Graph Theory
- Scale-Space
- Biomed. Signal Process. Control.
- ISNN (4)
- ECCV
- Signal Process.
- EMBC
- Random Struct. Algorithms
- IEICE Trans. Electron.
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