EDGE LOCALIZATION
Experts
- Rachid Deriche
- J. Andrew Bangham
- Bernard De Baets
- Luc Florack
- Josef Kittler
- Carlos Lopez-Molina
- Richard W. Harvey
- Grégoire Malandain
- Jean Pierre Cocquerez
- Djemel Ziou
- Muhittin Gökmen
- Olivier Monga
- Alison Bosson
- Humberto Bustince Sola
- Michel Chapron
- Qian-Ru Wei
- Martin Simonovsky
- Augusto Sarti
- Ramakrishna Kakarala
- Yu-Li You
- Donna J. Williams
- Andrew Knyazev
- Stefano Tubaro
- Mostafa Kaveh
- Mikel Galar
- Geert Leus
- Federico Pedersini
- Piet W. Verbeek
- Nikos Komodakis
- Wenhua Ma
- Lucas J. van Vliet
- Alfred O. Hero III
- Baptiste Magnier
- K. Paler
- Yi Lu
- Mario Coutino
- Robert M. Haralick
- Mubarak Shah
- Philippe Montesinos
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- J. Math. Imaging Vis.
- Pattern Recognit.
- IGARSS
- CVPR
- Discret. Math.
- EUSIPCO
- Image Vis. Comput.
- ICPR (1)
- ICASSP
- VCIP
- ICIP
- BMVC
- Electron. J. Comb.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Vis. Image Underst.
- ACIVS
- Ars Comb.
- ECCV (1)
- ICIAP
- J. Multiple Valued Log. Soft Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- Multim. Tools Appl.
- J. Graph Theory
- Scale-Space
- IEEE Access
- ICPR (3)
- ICIP (3)
- MECO
- J. Electronic Imaging
- Biomed. Signal Process. Control.
- ECCV (2)
- Trans. Comput. Collect. Intell.
- ICEIC
- CAINE
- Symmetry
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