EDGE LOCALIZATION
Experts
- J. Andrew Bangham
- Rachid Deriche
- Carlos Lopez-Molina
- Luc Florack
- Josef Kittler
- Richard W. Harvey
- Bernard De Baets
- Humberto Bustince Sola
- Jean Pierre Cocquerez
- Grégoire Malandain
- Djemel Ziou
- Olivier Monga
- Muhittin Gökmen
- Alison Bosson
- Philippe Montesinos
- Federico Pedersini
- Haruko Okamura
- Stefano Tubaro
- Anil K. Jain
- Lucas J. van Vliet
- T. Hoang Ngan Le
- Andrew Knyazev
- Ramesh C. Jain
- Mubarak Shah
- Donna J. Williams
- Chin-Chen Chang
- Ramakrishna Kakarala
- Nikos Komodakis
- Alfred O. Hero III
- Yi Lu
- Geert Leus
- Michel Chapron
- Mostafa Kaveh
- John Illingworth
- Salvatore Tabbone
- Baptiste Magnier
- Qian-Ru Wei
- Stephen J. Sangwine
- K. Paler
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- J. Math. Imaging Vis.
- IGARSS
- EUSIPCO
- Discret. Math.
- Image Vis. Comput.
- CVPR
- ACIVS
- VCIP
- ICASSP
- ICIP
- Comput. Vis. Image Underst.
- BMVC
- Electron. J. Comb.
- ICPR (1)
- IEEE Geosci. Remote. Sens. Lett.
- ICPR (3)
- ECCV (1)
- Ars Comb.
- Scale-Space
- IEEE Access
- J. Electronic Imaging
- ICIP (3)
- ICIAP
- J. Multiple Valued Log. Soft Comput.
- MECO
- J. Graph Theory
- Biomed. Signal Process. Control.
- Multim. Tools Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- ECCV (2)
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- IWANN (1)
- SN Comput. Sci.
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