EDGE LOCALIZATION
Experts
- Rachid Deriche
- J. Andrew Bangham
- Richard W. Harvey
- Josef Kittler
- Bernard De Baets
- Luc Florack
- Carlos Lopez-Molina
- Alison Bosson
- Muhittin Gökmen
- Humberto Bustince Sola
- Jean Pierre Cocquerez
- Djemel Ziou
- Grégoire Malandain
- Olivier Monga
- Baptiste Magnier
- Qian-Ru Wei
- Stephen J. Sangwine
- Salvatore Tabbone
- John Illingworth
- Mostafa Kaveh
- Arjan Kuijper
- Robert M. Haralick
- Augusto Sarti
- Martin Simonovsky
- Wenhua Ma
- Mario Coutino
- K. Paler
- Yu-Li You
- Mikel Galar
- Mads Nielsen
- Piet W. Verbeek
- James J. Clark
- Haruko Okamura
- Federico Pedersini
- Philippe Montesinos
- Anil K. Jain
- Stefano Tubaro
- Donna J. Williams
- Chin-Chen Chang
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- J. Math. Imaging Vis.
- Pattern Recognit.
- CVPR
- IGARSS
- Discret. Math.
- EUSIPCO
- Image Vis. Comput.
- IEEE Geosci. Remote. Sens. Lett.
- ICASSP
- VCIP
- ACIVS
- ICIP
- Comput. Vis. Image Underst.
- BMVC
- Electron. J. Comb.
- ICPR (1)
- J. Multiple Valued Log. Soft Comput.
- J. Graph Theory
- MECO
- Int. J. Pattern Recognit. Artif. Intell.
- Multim. Tools Appl.
- Biomed. Signal Process. Control.
- ICPR (3)
- ECCV (1)
- J. Electronic Imaging
- ICIP (3)
- IEEE Access
- Ars Comb.
- Scale-Space
- ICIAP
- ISCAS
- Math. Comput. Model.
- SIAM J. Appl. Math.
- ITNAC
- ISCAS (2)
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