EDGE LOCALIZATION
Experts
- Rachid Deriche
- J. Andrew Bangham
- Bernard De Baets
- Josef Kittler
- Luc Florack
- Carlos Lopez-Molina
- Richard W. Harvey
- Olivier Monga
- Muhittin Gökmen
- Grégoire Malandain
- Djemel Ziou
- Jean Pierre Cocquerez
- Humberto Bustince Sola
- Alison Bosson
- K. Paler
- Lucas J. van Vliet
- James J. Clark
- Andrew Knyazev
- Yu-Li You
- Geert Leus
- Haruko Okamura
- Mubarak Shah
- Nikos Komodakis
- Mostafa Kaveh
- Chin-Chen Chang
- Qian-Ru Wei
- Arjan Kuijper
- Alfred O. Hero III
- Philippe Montesinos
- Michel Chapron
- Ramesh C. Jain
- Piet W. Verbeek
- Robert M. Haralick
- Mads Nielsen
- Mario Coutino
- Stefano Tubaro
- Augusto Sarti
- Donna J. Williams
- Yi Lu
Venues
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- IEEE Trans. Image Process.
- Pattern Recognit.
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- CVPR
- IGARSS
- Discret. Math.
- EUSIPCO
- Image Vis. Comput.
- ACIVS
- BMVC
- ICPR (1)
- ICASSP
- Electron. J. Comb.
- IEEE Geosci. Remote. Sens. Lett.
- VCIP
- ICIP
- Comput. Vis. Image Underst.
- J. Electronic Imaging
- IEEE Access
- ICPR (3)
- ICIAP
- J. Multiple Valued Log. Soft Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- J. Graph Theory
- Biomed. Signal Process. Control.
- Ars Comb.
- ICIP (3)
- Multim. Tools Appl.
- MECO
- ECCV (1)
- Scale-Space
- Discret. Appl. Math.
- Multidimens. Syst. Signal Process.
- J. Comb. Optim.
- SIAM J. Appl. Math.
- Real Time Imaging
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