CORRECT CLASSIFICATION RATE
Experts
- Yongsheng Dong
- André Ricardo Backes
- Paul W. Fieguth
- Jarbas Joaci de Mesquita Sá Junior
- Li Liu
- Yo Horikawa
- Alice Porebski
- Matti Pietikäinen
- Raimondo Schettini
- Paul F. Whelan
- Dipak Kumar Ghosh
- Lintao Zheng
- Odemir Martinez Bruno
- Swalpa Kumar Roy
- Nicolas Vandenbroucke
- Paolo Napoletano
- Bidyut B. Chaudhuri
- Ngoc-Son Vu
- Michael Gadermayr
- Andreas Uhl
- Domenec Puig
- Youssef El Merabet
- Shiv Ram Dubey
- Claudio Cusano
- Bhabatosh Chanda
- Ludovic Macaire
- Yu-Long Qiao
- Nasir M. Rajpoot
- Lin Wang
- Ioannis Giotis
- Guoying Zhao
- Vu-Lam Nguyen
- Chunlei Yang
- Shutao Li
- Shreekant Gayaka
- Véronique Haese-Coat
- Licheng Jiao
- Robert DiBiano
- Jinwen Ma
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- ICASSP
- ICIP (3)
- ICPR
- Comput. Vis. Image Underst.
- IEEE Access
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Vis. Comput.
- Multim. Tools Appl.
- Neural Comput. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- EMBC
- IEEE Signal Process. Lett.
- Neurocomputing
- Digit. Signal Process.
- IEEE Trans. Image Process.
- BMVC
- ACSSC
- IEEE Trans. Circuits Syst. Video Technol.
- SSPR/SPR
- Sensors
- EUSIPCO
- ISNN (2)
- IJCNN
- J. Electronic Imaging
- Appl. Soft Comput.
- Int. J. Comput. Vis.
- SCIA
- CVPR
- ICPR (2)
- Remote. Sens.
- J. Imaging
- ICIAR
- Image Vis. Comput.
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