CORRECT CLASSIFICATION RATE
Experts
- Yongsheng Dong
- Paul W. Fieguth
- André Ricardo Backes
- Jarbas Joaci de Mesquita Sá Junior
- Li Liu
- Yo Horikawa
- Alice Porebski
- Bidyut B. Chaudhuri
- Raimondo Schettini
- Odemir Martinez Bruno
- Swalpa Kumar Roy
- Nicolas Vandenbroucke
- Lintao Zheng
- Matti Pietikäinen
- Paul F. Whelan
- Paolo Napoletano
- Dipak Kumar Ghosh
- Ngoc-Son Vu
- Ludovic Macaire
- Claudio Cusano
- Youssef El Merabet
- Bhabatosh Chanda
- Andreas Uhl
- Yu-Long Qiao
- Domenec Puig
- Shiv Ram Dubey
- Michael Gadermayr
- Lin Wang
- Nasir M. Rajpoot
- Guoying Zhao
- Joseph Ronsin
- Jiexin Pu
- Miguel Ángel García
- Supratik Mukhopadhyay
- Yan Qiu Chen
- Ovidiu Ghita
- Mingxin Jin
- Véronique Haese-Coat
- Chun-Hui Zhao
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- ICASSP
- ICIP (3)
- ICPR
- IGARSS
- Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- Comput. Vis. Image Underst.
- Expert Syst. Appl.
- IEEE Access
- Neural Comput. Appl.
- EMBC
- IEEE Signal Process. Lett.
- Neurocomputing
- Int. J. Pattern Recognit. Artif. Intell.
- SSPR/SPR
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Image Process.
- BMVC
- Digit. Signal Process.
- ACSSC
- Sensors
- Image Vis. Comput.
- MVA
- Remote. Sens.
- Appl. Soft Comput.
- J. Imaging
- EGC
- ICIAR
- J. Electronic Imaging
- CVPR
- CIARP
- ISNN (2)
- EUSIPCO
- Int. J. Comput. Vis.
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