CORRECT CLASSIFICATION RATE
Experts
- Yongsheng Dong
- Paul W. Fieguth
- André Ricardo Backes
- Jarbas Joaci de Mesquita Sá Junior
- Li Liu
- Yo Horikawa
- Dipak Kumar Ghosh
- Odemir Martinez Bruno
- Lintao Zheng
- Alice Porebski
- Swalpa Kumar Roy
- Raimondo Schettini
- Bidyut B. Chaudhuri
- Paolo Napoletano
- Matti Pietikäinen
- Paul F. Whelan
- Nicolas Vandenbroucke
- Andreas Uhl
- Youssef El Merabet
- Yu-Long Qiao
- Shiv Ram Dubey
- Domenec Puig
- Claudio Cusano
- Michael Gadermayr
- Ludovic Macaire
- Bhabatosh Chanda
- Lin Wang
- Nasir M. Rajpoot
- Ngoc-Son Vu
- Denis Hamad
- Michael Biehl
- Kerstin Bunte
- Nicolai Petkov
- Xuelong Li
- Jane You
- Maria Petrou
- Shreekant Gayaka
- Abdulkadir Sengür
- Andrew Zisserman
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- ICIP (3)
- ICASSP
- ICPR
- Comput. Vis. Image Underst.
- Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Expert Syst. Appl.
- IEEE Access
- Neural Comput. Appl.
- Neurocomputing
- Multim. Tools Appl.
- IEEE Signal Process. Lett.
- EMBC
- Int. J. Pattern Recognit. Artif. Intell.
- SSPR/SPR
- IEEE Trans. Image Process.
- ACSSC
- BMVC
- Digit. Signal Process.
- IEEE Trans. Circuits Syst. Video Technol.
- ICIAR
- CVPR
- EUSIPCO
- ISNN (2)
- Sensors
- CIARP
- J. Electronic Imaging
- J. Imaging
- ICPR (2)
- IJCNN
- MVA
- Int. J. Comput. Vis.
- Appl. Soft Comput.
- Image Vis. Comput.
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