CORRECT CLASSIFICATION RATE
Experts
- Yongsheng Dong
- Paul W. Fieguth
- Jarbas Joaci de Mesquita Sá Junior
- André Ricardo Backes
- Yo Horikawa
- Li Liu
- Dipak Kumar Ghosh
- Matti Pietikäinen
- Odemir Martinez Bruno
- Paolo Napoletano
- Nicolas Vandenbroucke
- Paul F. Whelan
- Alice Porebski
- Swalpa Kumar Roy
- Bidyut B. Chaudhuri
- Raimondo Schettini
- Lintao Zheng
- Claudio Cusano
- Shiv Ram Dubey
- Lin Wang
- Michael Gadermayr
- Youssef El Merabet
- Andreas Uhl
- Ludovic Macaire
- Domenec Puig
- Bhabatosh Chanda
- Ngoc-Son Vu
- Nasir M. Rajpoot
- Yu-Long Qiao
- Robert M. Gray
- Saikat Basu
- Nicolai Petkov
- Chun-Yan Song
- Miguel Ángel García
- Vu-Lam Nguyen
- Jiexin Pu
- Kerstin Bunte
- Maria Petrou
- Dacheng Tao
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- ICASSP
- ICIP (3)
- ICPR
- Multim. Tools Appl.
- Comput. Vis. Image Underst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- IEEE Access
- Vis. Comput.
- IGARSS
- Neurocomputing
- EMBC
- IEEE Signal Process. Lett.
- Int. J. Pattern Recognit. Artif. Intell.
- Neural Comput. Appl.
- IEEE Trans. Circuits Syst. Video Technol.
- ACSSC
- IEEE Trans. Image Process.
- SSPR/SPR
- BMVC
- Digit. Signal Process.
- J. Electronic Imaging
- Int. J. Comput. Vis.
- ICPR (2)
- EUSIPCO
- Sensors
- IJCNN
- Appl. Soft Comput.
- J. Imaging
- SCIA
- CIARP
- MVA
- ICIAR
- Image Vis. Comput.
- Remote. Sens.
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