CORRECT CLASSIFICATION RATE
Experts
- Yongsheng Dong
- Jarbas Joaci de Mesquita Sá Junior
- Paul W. Fieguth
- André Ricardo Backes
- Yo Horikawa
- Li Liu
- Paolo Napoletano
- Bidyut B. Chaudhuri
- Nicolas Vandenbroucke
- Swalpa Kumar Roy
- Lintao Zheng
- Odemir Martinez Bruno
- Dipak Kumar Ghosh
- Paul F. Whelan
- Matti Pietikäinen
- Raimondo Schettini
- Alice Porebski
- Lin Wang
- Yu-Long Qiao
- Nasir M. Rajpoot
- Ludovic Macaire
- Bhabatosh Chanda
- Claudio Cusano
- Shiv Ram Dubey
- Domenec Puig
- Youssef El Merabet
- Andreas Uhl
- Michael Gadermayr
- Ngoc-Son Vu
- Miguel Ángel García
- Mingxin Jin
- Kerstin Bunte
- Dacheng Tao
- Philippe-Henri Gosselin
- Supratik Mukhopadhyay
- Robert M. Gray
- Xuelong Li
- Abdulkadir Sengür
- Yannick Berthoumieu
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- ICIP
- ICASSP
- ICIP (3)
- ICPR
- IEEE Access
- Comput. Vis. Image Underst.
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Vis. Comput.
- Multim. Tools Appl.
- EMBC
- Int. J. Pattern Recognit. Artif. Intell.
- Neural Comput. Appl.
- IEEE Signal Process. Lett.
- Neurocomputing
- Digit. Signal Process.
- BMVC
- IEEE Trans. Image Process.
- ACSSC
- IEEE Trans. Circuits Syst. Video Technol.
- SSPR/SPR
- ISNN (2)
- EUSIPCO
- Sensors
- J. Electronic Imaging
- IJCNN
- CVPR
- Int. J. Comput. Vis.
- SCIA
- Appl. Soft Comput.
- ICPR (2)
- Remote. Sens.
- Image Vis. Comput.
- J. Imaging
- ICIAR
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