BINARY AND GRAY SCALE
Experts
- Péter Balázs
- Dan Schonfeld
- Edward R. Dougherty
- T. Yung Kong
- Pasi Fränti
- Frank Y. Shih
- Eugene I. Ageenko
- Wei Lu
- Chyi-Jou Gau
- Peer Stelldinger
- Ullrich Köthe
- Keiichi Abe
- Debranjan Sarkar
- Humberto Sossa
- Yingjie Xue
- Kuo-Liang Chung
- Robert M. Haralick
- Yuileong Yeung
- John Goutsias
- Hae Yong Kim
- Lifeng Shang
- Javier Vidal
- Rein van den Boomgaard
- Harry Wechsler
- Michel Jourlin
- Alan H. Rowberg
- Octavia I. Camps
- Azriel Rosenfeld
- Yoshiharu Fujisawa
- Fethi Jarray
- Ronald W. Schafer
- Divyendu Sinha
- Koji Nakano
- Bernard De Baets
- José Crespo
- Toshiaki Fujii
- Ghassen Tlig
- Anan Yaagoub
- Tomás Suk
Venues
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CoRR
- Multim. Tools Appl.
- DGCI
- J. Math. Imaging Vis.
- ICDAR
- ICASSP
- ICPR (3)
- MVA
- J. Vis. Commun. Image Represent.
- ICIP
- Systems and Computers in Japan
- Int. J. Pattern Recognit. Artif. Intell.
- CVGIP Graph. Model. Image Process.
- IWCIA
- Comput. Vis. Image Underst.
- Comput. Graph.
- CAIP
- Real Time Imaging
- J. Electronic Imaging
- Data Compression Conference
- IWDW
- Neurocomputing
- MCPR
- Int. J. Imaging Syst. Technol.
- Softw. Pract. Exp.
- ICPR
- ICIP (1)
- J. Digit. Imaging
- ISMM
- Image Vis. Comput.
- IEEE Trans. Circuits Syst. Video Technol.
- ACIVS
- ISVC (2)
- Sensors
- FG
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