BINARY AND GRAY SCALE
Experts
- Dan Schonfeld
- Péter Balázs
- Edward R. Dougherty
- T. Yung Kong
- Pasi Fränti
- Frank Y. Shih
- Debranjan Sarkar
- Yuileong Yeung
- Yingjie Xue
- Wei Lu
- John Goutsias
- Kuo-Liang Chung
- Chyi-Jou Gau
- Ullrich Köthe
- Keiichi Abe
- Robert M. Haralick
- Eugene I. Ageenko
- Humberto Sossa
- Peer Stelldinger
- Jun Liu
- Lidija Comic
- Hae Yong Kim
- Huafeng Qin
- Wilfrido Gómez-Flores
- Chin-Chen Chang
- Keita Takahashi
- Azriel Rosenfeld
- Paola Magillo
- Adnan A. Y. Mustafa
- Wai-Tak Wong
- Kuo-Chin Fan
- Alan H. Rowberg
- Anan Yaagoub
- Takahiko Horiuchi
- Hassan Qjidaa
- Peter Sussner
- Tomás Suk
- Peter Gritzmann
- Victor Maojo
Venues
- IEEE Trans. Image Process.
- Pattern Recognit.
- Pattern Recognit. Lett.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- DGCI
- J. Math. Imaging Vis.
- ICDAR
- ICASSP
- ICPR (3)
- MVA
- Systems and Computers in Japan
- J. Vis. Commun. Image Represent.
- ICIP
- Int. J. Pattern Recognit. Artif. Intell.
- CVGIP Graph. Model. Image Process.
- Comput. Vis. Image Underst.
- Comput. Graph.
- CAIP
- J. Electronic Imaging
- IWCIA
- Real Time Imaging
- Int. J. Imaging Syst. Technol.
- ICIP (1)
- Image Processing: Algorithms and Systems
- IEEE Trans. Circuits Syst. Video Technol.
- Neurocomputing
- ICME
- ICIC (1)
- ISMM
- FG
- Comput. Vis. Graph. Image Process.
- IWDW
- IIH-MSP
- Sensors
- ISVC (2)
- MCPR
- Data Compression Conference
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