Xiaodong Zhang

Publication Activity (10 Years)

Years Active: 2020-2024
Publications (10 Years): 10

Top Topics

Top Venues

IEEE Trans. Instrum. Meas.

IEEE Instrum. Meas. Mag.

IEEE Trans. Ind. Electron.

Publications

Chen Yang, Changshuai Fang, Zhengwen Li, Qianwen Wang, Xiaodong Zhang
An Improved SFS Method for Achieving Fast, High-Precision, and Widely Adaptable 3-D Reconstruction. IEEE Trans. Instrum. Meas. 73 (2024)
Changshuai Fang, Fengzhou Fang, Xiaodong Zhang
Research on Geometric Measurement Technology of the Inner Cavity of Cylindrical Parts. IEEE Trans. Ind. Electron. 71 (5) (2024)
Ning Yan, Dongxue Wang, Lei Liu, Zhuotong Li, Shuaipeng Yuan, Xiaodong Zhang
A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components. IEEE Trans. Image Process. 33 (2024)
Xianrui Li, Bin Xu, Xiaodong Zhang, Wenjun Ni
An Apparatus and Method for Measuring Sand Content Based on Near-Infrared Shortwave Scattering. IEEE Instrum. Meas. Mag. 26 (6) (2023)
Ning Yan, Linlin Zhu, Hongmai Yang, Nana Li, Xiaodong Zhang
Online Yarn Breakage Detection: A Reflection-Based Anomaly Detection Method. IEEE Trans. Instrum. Meas. 70 (2021)
Zhen Zeng, Zexiao Li, Fengzhou Fang, Xiaodong Zhang
Phase Compensation of the Non-Uniformity of the Liquid Crystal on Silicon Spatial Light Modulator at Pixel Level. Sensors 21 (3) (2021)
Li Miao, Linlin Zhu, Changshuai Fang, Ning Yan, Xudong Yang, Xiaodong Zhang
Modeling and Analysis of System Error for Highly Curved Freeform Surface Measurement by Noncontact Dual-Axis Rotary Scanning. Sensors 21 (2) (2021)
Lei Liu, Linlin Zhu, Li Miao, Chen Li, Changshuai Fang, Xiaodong Zhang
Overall Profile Measurements of Tiny Parts with Complicated Features with the Cradle-Type Five-Axis System. Sensors 21 (13) (2021)
You Wu, Xiaodong Zhang, Fengzhou Fang
Automatic Fabric Defect Detection Using Cascaded Mixed Feature Pyramid with Guided Localization. Sensors 20 (3) (2020)
Linlin Zhu, Yuchu Dong, Zexiao Li, Xiaodong Zhang
A Novel Surface Recovery Algorithm for Dual Wavelength White LED in Vertical Scanning Interferometry (VSI). Sensors 20 (18) (2020)