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William E. Cobb
Publication Activity (10 Years)
Years Active: 2012-2013
Publications (10 Years): 0
Top Topics
Integrated Circuit
Application Layer
Bit Error Rate
Information Leakage
Top Venues
IEEE Trans. Inf. Forensics Secur.
ACM Trans. Inf. Syst. Secur.
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Publications
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William E. Cobb
,
Rusty O. Baldwin
,
Eric D. Laspe
Leakage Mapping: A Systematic Methodology for Assessing the Side-Channel Information Leakage of Cryptographic Implementations.
ACM Trans. Inf. Syst. Secur.
16 (1) (2013)
William E. Cobb
,
Eric D. Laspe
,
Rusty O. Baldwin
,
Michael A. Temple
,
Yong C. Kim
Intrinsic Physical-Layer Authentication of Integrated Circuits.
IEEE Trans. Inf. Forensics Secur.
7 (1) (2012)