Tianmei Li

Publication Activity (10 Years)

Years Active: 2016-2023
Publications (10 Years): 13

Top Topics

Top Venues

IEEE Trans. Reliab.

Sci. China Inf. Sci.

CAA SAFEPROCESS

IEEE Trans. Syst. Man Cybern. Syst.

Publications

Hong Pei, Xiao-Sheng Si, Changhua Hu, Tianmei Li, Chuan He, Zhenan Pang
Bayesian Deep-Learning-Based Prognostic Model for Equipment Without Label Data Related to Lifetime. IEEE Trans. Syst. Man Cybern. Syst. 53 (1) (2023)
Tianmei Li, Hong Pei, Xiaosheng Si, Yaguo Lei
Prognosis for stochastic degrading systems with massive data: A data-model interactive perspective. Reliab. Eng. Syst. Saf. 237 (2023)
Xiao-Sheng Si, Tianmei Li, Jianxun Zhang, Yaguo Lei
Nonlinear degradation modeling and prognostics: A Box-Cox transformation perspective. Reliab. Eng. Syst. Saf. 217 (2022)
Hong Pei, Xiao-Sheng Si, Chang-Hua Hu, Jian-Fei Zheng, Tianmei Li, Jianxun Zhang, Zhenan Pang
An adaptive prognostics method for fusing CDBN and diffusion process: Application to bearing data. Neurocomputing 421 (2021)
Yuzhe Ma, Tianmei Li, Xiaosheng Si, Changhua Hu, Shengfei Zhang, Hao Zhang
Sneak circuit analysis considering component performance degradation under digital twin model. CAA SAFEPROCESS (2021)
Xiaosheng Si, Changhua Hu, Tianmei Li, Qi Zhang
A joint order-replacement policy for deteriorating components with reliability constraint. Sci. China Inf. Sci. 64 (8) (2021)
Xiaosheng Si, Tianmei Li, Qi Zhang
Optimal replacement of degrading components: a control-limit policy. Sci. China Inf. Sci. 64 (10) (2021)
Shengfei Zhang, Tianmei Li, Xiaosheng Si, Changhua Hu, Hao Zhang, Yuzhe Ma
A New Missing Data Generation Method Based on An Improved DCGAN With Application to RUL Prediction. CAA SAFEPROCESS (2021)
Tianmei Li, Xiaosheng Si, Zonghao Yang, Hong Pei, Yuzhe Ma
NHPP Testability Growth Model Considering Testability Growth Effort, Rectifying Delay, and Imperfect Correction. IEEE Access 8 (2020)
Tianmei Li, Hong Pei, Zhenan Pang, Xiaosheng Si, Jian-Fei Zheng
A Sequential Bayesian Updated Wiener Process Model for Remaining Useful Life Prediction. IEEE Access 8 (2020)
Xiaosheng Si, Tianmei Li, Qi Zhang
A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements. IEEE Trans. Reliab. 68 (3) (2019)
Xiaosheng Si, Tianmei Li, Qi Zhang, Xiaoxiang Hu
An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals. IEEE Trans. Reliab. 67 (3) (2018)
Chenxu Zhao, Krishna R. Pattipati, Guanjun Liu, Jing Qiu, Kehong Lv, Tianmei Li
A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function. IEEE Trans. Syst. Man Cybern. Syst. 46 (4) (2016)