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Sujeong Baek
ORCID
Publication Activity (10 Years)
Years Active: 2017-2022
Publications (10 Years): 9
Top Topics
Improves The Classification Accuracy
Multivariate Time Series
Sensitivity Analysis
Histogram Intersection Kernel
Top Venues
Sensors
APMS (1)
IEEE Trans. Cybern.
SNPD Winter
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Publications
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Na Hyeon Yu
,
Sujeong Baek
Fault Detection in Automatic Manufacturing Processes via 2D Image Analysis Using a Combined CNN-LSTM Model.
APMS (1)
(2022)
Yebon Lee
,
Sujeong Baek
Multiple Operational Status Classification Based on One-Versus-One SVM in FDM 3D Printer.
APMS (1)
(2022)
Sujeong Baek
,
Yong-Uk Song
Abrupt covariance based signal extraction for fault prediction of an aircraft engine.
SNPD Winter
(2021)
Duck Young Kim
,
Jin Woo Park
,
Sujeong Baek
,
K.-B. Park
,
H.-R. Kim
,
J.-I. Park
,
H.-S. Kim
,
B.-B. Kim
,
H.-Y. Oh
,
Kichang Namgung
,
Woonsang Baek
A modular factory testbed for the rapid reconfiguration of manufacturing systems.
J. Intell. Manuf.
31 (3) (2020)
Kichang Namgung
,
Hyunsik Yoon
,
Sujeong Baek
,
Duck Young Kim
Estimating System State through Similarity Analysis of Signal Patterns.
Sensors
20 (23) (2020)
Sujeong Baek
,
Duck Young Kim
Fault Prediction via Symptom Pattern Extraction Using the Discretized State Vectors of Multisensor Signals.
IEEE Trans. Ind. Informatics
15 (2) (2019)
Sujeong Baek
,
Duck Young Kim
Abrupt variance and discernibility analyses of multi-sensor signals for fault pattern extraction.
Comput. Ind. Eng.
128 (2019)
Woonsang Baek
,
Sujeong Baek
,
Duck Young Kim
Characterization of System Status Signals for Multivariate Time Series Discretization Based on Frequency and Amplitude Variation.
Sensors
18 (1) (2018)
Sujeong Baek
,
Duck Young Kim
Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data.
IEEE Trans. Cybern.
47 (5) (2017)