Stefan H. Steiner

Publication Activity (10 Years)

Years Active: 2000-2024
Publications (10 Years): 6

Top Topics

Class Probability Estimation

Nearest Neighbor

Top Venues

Qual. Reliab. Eng. Int.

PeerJ Comput. Sci.

Publications

Adel Ahmadi Nadi, Stefan H. Steiner, Nathaniel T. Stevens
Assessing Measurement System Agreement in the Presence of Reproducibility and Repeatability. Technometrics 66 (3) (2024)
Michael S. Hamada, Emily M. Casleton, Dave Osthus, Brian P. Weaver, Stefan H. Steiner
Analyzing count data with measurement error. Qual. Reliab. Eng. Int. 38 (5) (2022)
Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner
Nearest labelset using double distances for multi-label classification. PeerJ Comput. Sci. 5 (2019)
Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner
The k conditional nearest neighbor algorithm for classification and class probability estimation. PeerJ Comput. Sci. 5 (2019)
Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner
Nearest Labelset Using Double Distances for Multi-label Classification. CoRR (2017)
Michael S. Hamada, Stefan H. Steiner, R. Jock MacKay, C. Shane Reese
Planning and Analyzing Experiments with Models that Distinguish Between Replicates and Repeats. Qual. Reliab. Eng. Int. 33 (3) (2017)
Oana Danila, Stefan H. Steiner, R. Jock MacKay
Assessing a Binary Measurement System With Varying Misclassification Rates When a Gold Standard Is Available. Technometrics 55 (3) (2013)
Hugh A. Chipman, R. Jock MacKay, Stefan H. Steiner
Comment. Technometrics 52 (3) (2010)
Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner
Leveraged Gauge R&R Studies. Technometrics 52 (3) (2010)
Stefan H. Steiner, Kristina Grant, Michael Coory, Heath A. Kelly
Detecting the start of an influenza outbreak using exponentially weighted moving average charts. BMC Medical Informatics Decis. Mak. 10 (2010)
Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner
Two-Stage Leveraged Measurement System Assessment. Technometrics 51 (3) (2009)
Stefan H. Steiner, R. Jock MacKay
Scale Counting. Technometrics 46 (3) (2004)
Stefan H. Steiner
Statistical Process Control Using Two Measurement Systems. Technometrics 42 (2) (2000)