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Shigeru Sawada
Publication Activity (10 Years)
Years Active: 2008-2017
Publications (10 Years): 1
Top Topics
Printed Circuit Boards
Deformation Field
Thin Film
Contact Force
Top Venues
IEICE Trans. Electron.
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Publications
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Shigeru Sawada
,
Song-Zhu Kure-Chu
,
Rie Nakagawa
,
Toru Ogasawara
,
Hitoshi Yashiro
,
Yasushi Saitoh
Effect of Hardness on Wear and Abrasion Resistance of Silver Plating on Copper Alloy.
IEICE Trans. Electron.
(9) (2017)
Terutaka Tamai
,
Shigeru Sawada
,
Yasuhiro Hattori
Deformation of Crystal Morphology in Tin Plated Contact Layer Caused by Loading.
IEICE Trans. Electron.
(9) (2012)
Terutaka Tamai
,
Shigeru Sawada
,
Yasuhiro Hattori
Contact Mechanisms and Contact Resistance Characteristics of Solid Tin and Plated Tin Contacts Used for Connectors.
IEICE Trans. Electron.
(5) (2010)
Shigeru Sawada
,
Terutaka Tamai
,
Yasuhiro Hattori
,
Kazuo Iida
Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction.
IEICE Trans. Electron.
(6) (2010)
Shigeru Sawada
,
Kaori Shimizu
,
Yasuhiro Hattori
,
Terutaka Tamai
Constriction Resistance Behavior of a Tin or Silver Plated Layer for an Electrical Contact.
IEICE Trans. Electron.
(4) (2010)
Hirosaka Ikeda
,
Tetsuya Ito
,
Shigeru Sawada
,
Yasuhiro Hattori
,
Yasushi Saitoh
,
Terutaka Tamai
,
Kazuo Iida
Influence of Fretting Wear on Lifetime of Tin Plated Connectors.
IEICE Trans. Electron.
(9) (2009)
Kaori Shimizu
,
Shigeki Shimada
,
Shigeru Sawada
,
Yasuhiro Hattori
Contact Area Analysis by FEM with Plating Layer for Electrical Contact.
IEICE Trans. Electron.
(8) (2009)
Tetsuya Ito
,
Shigeru Sawada
,
Yasuhiro Hattori
,
Yasushi Saitoh
,
Terutaka Tamai
,
Kazuo Iida
Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness.
IEICE Trans. Electron.
(8) (2008)