Pieter Verboven

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 10

Top Topics

Tomographic Images

Top Venues

Comput. Electron. Agric.

ICCV (Workshops)

Expert Syst. Appl.

Publications

Astrid Tempelaere, Leen Van Doorselaer, Jiaqi He, Pieter Verboven, Tinne Tuytelaars, Bart M. Nicolaï
Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging. ICCV (Workshops) (2023)
Astrid Tempelaere, Hoang Minh Phan, Tim Van De Looverbosch, Pieter Verboven, Bart M. Nicolaï
Non-destructive internal disorder segmentation in pear fruit by X-ray radiography and AI. Comput. Electron. Agric. 212 (2023)
Tim Van De Looverbosch, Jiaqi He, Astrid Tempelaere, Klaas Kelchtermans, Pieter Verboven, Tinne Tuytelaars, Jan Sijbers, Bart M. Nicolaï
Inline nondestructive internal disorder detection in pear fruit using explainable deep anomaly detection on X-ray images. Comput. Electron. Agric. 197 (2022)
Tim Van De Looverbosch, Bert Vandenbussche, Pieter Verboven, Bart M. Nicolaï
Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning. Comput. Electron. Agric. 200 (2022)
Tim Van De Looverbosch, Ellen Raeymaekers, Pieter Verboven, Jan Sijbers, Bart M. Nicolaï
Non-destructive internal disorder detection of Conference pears by semantic segmentation of X-ray CT scans using deep learning. Expert Syst. Appl. 176 (2021)
Eskindir E. Tadesse, Hirut Assaye, Mulugeta A. Delele, Solomon W. Fanta, Dawit F. Huluka, Melkamu Alemayehu, Getachew Alemayehu, Enyew Adgo, Jan Nyssen, Pieter Verboven, Bart M. Nicolaï
Quantitative Postharvest Loss Assessment of Tomato Along the Postharvest Supply Chain in Northwestern Ethiopia. ICAST (1) (2020)
Wentao Wu, Paul Cronjé, Bart M. Nicolaï, Pieter Verboven, Umezuruike Linus Opara, Thijs Defraeye
Virtual cold chain method to model the postharvest temperature history and quality evolution of fresh fruit - A case study for citrus fruit packed in a single carton. Comput. Electron. Agric. 144 (2018)
Luis F. Alves Pereira, Eline Janssens, George D. C. Cavalcanti, Ing Ren Tsang, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers
Inline discrete tomography system: Application to agricultural product inspection. Comput. Electron. Agric. 138 (2017)
Antonio Derossi, Bart M. Nicolaï, Pieter Verboven, C. Severini
Characterizing apple microstructure via directional statistical correlation functions. Comput. Electron. Agric. 138 (2017)
Wouter Devarrewaere, Udo Heimbach, Dieter Foqué, Bart M. Nicolaï, David Nuyttens, Pieter Verboven
Wind tunnel and CFD study of dust dispersion from pesticide-treated maize seed. Comput. Electron. Agric. 128 (2016)
Eline Janssens, Jan De Beenhouwer, Mattias Van Dael, Pieter Verboven, Bart M. Nicolaï, Jan Sijbers
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP (2015)
Q. Tri Ho, Pieter Verboven, Bert E. Verlinden, Jeroen Lammertyn, Stefan Vandewalle, Bart M. Nicolaï
A Continuum Model for Metabolic Gas Exchange in Pear Fruit. PLoS Comput. Biol. 4 (3) (2008)