C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Jaeyung Jun
ORCID
Publication Activity (10 Years)
Years Active: 2016-2023
Publications (10 Years): 7
Top Topics
Nearest Neighbor
Damage Assessment
Grid Cells
Memory Management
Top Venues
ACM Trans. Design Autom. Electr. Syst.
BigComp
IEEE Trans. Consumer Electron.
IEICE Electron. Express
</>
Publications
</>
Seokhyun Ryu
,
Sohyun Kim
,
Jaeyung Jun
,
Donguk Moon
,
Kyungsoo Lee
,
Jungmin Choi
,
Sunwoong Kim
,
Hyungsoo Kim
,
Luke Kim
,
Won Ha Choi
,
Moohyeon Nam
,
Dooyoung Hwang
,
Hongchan Roh
,
Young-Pyo Joo
System Optimization of Data Analytics Platforms using Compute Express Link (CXL) Memory.
BigComp
(2023)
Jaeyung Jun
,
Yoonah Paik
,
Gyeong Il Min
,
Seon Wook Kim
,
Youngsun Han
Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management.
ACM Trans. Design Autom. Electr. Syst.
24 (4) (2019)
Kyu Hyun Choi
,
Jaeyung Jun
,
Minseong Kim
,
Seon Wook Kim
Reducing DRAM Refresh Rate Using Retention Time Aware Universal Hashing Redundancy Repair.
ACM Trans. Design Autom. Electr. Syst.
24 (5) (2019)
Seon Wook Kim
,
Sewon Park
,
Jaeyung Jun
,
Youngsun Han
Design and Implementation of Display Stream Compression Decoder With Line Buffer Optimization.
IEEE Trans. Consumer Electron.
65 (3) (2019)
Jaeyung Jun
,
Kyu Hyun Choi
,
Hokwon Kim
,
Sang Ho Yu
,
Seon Wook Kim
,
Youngsun Han
Recovering from Biased Distribution of Faulty Cells in Memory by Reorganizing Replacement Regions through Universal Hashing.
ACM Trans. Design Autom. Electr. Syst.
23 (2) (2018)
Kyu Hyun Choi
,
Jaeyung Jun
,
Hokwon Kim
,
Seon Wook Kim
,
Youngsun Han
A decoupled bit shifting technique using data encoding/decoding for DRAM redundancy repair.
IEICE Electron. Express
14 (13) (2017)
Hokyoon Lee
,
Yoonah Paik
,
Jaeyung Jun
,
Youngsun Han
,
Seon Wook Kim
High-throughput low-area design of AES using constant binary matrix-vector multiplication.
Microprocess. Microsystems
47 (2016)