Heui-Jae Pahk

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 1

Top Topics

Optical Coherence Tomography

Future Development

Thin Film Transistor

Top Venues

J. Electronic Imaging

Publications

Donghun Ku, Heui-Jae Pahk
Enhancing Battery Exterior Defect Inspection Accuracy Through Defect-Background Separated GAN Development. IEEE Access 12 (2024)
Sung-Hoon Park, Tai-Wook Kim, Jeong-Ho Lee, Heui-Jae Pahk
Real-time critical dimension measurement of thin film transistor liquid crystal display patterns using optical coherence tomography. J. Electronic Imaging 23 (1) (2014)
Nam-Thai Doan, Jun-Hee Moon, Tai-Wook Kim, Heui-Jae Pahk
Novel, fast, edge-directed image reconstruction algorithm using a substepping system for critical-dimension measurement of glass panels. J. Electronic Imaging 21 (3) (2012)