Éric Thiébaut

Publication Activity (10 Years)

Years Active: 2008-2020
Publications (10 Years): 12

Top Topics

Robust Detection

Blind Deconvolution

Image Reconstruction

Correlated Noise

Top Venues

Publications

Laurence Denneulin, Nelly Pustelnik, Maud Langlois, Ignace Loris, Éric Thiébaut
Primal-dual splitting scheme with backtracking for handling with epigraphic constraint and sparse analysis regularization. CoRR (2020)
Olivier Flasseur, Loïc Denis, Éric Thiébaut, Maud Langlois
Finding Meaningful Detections: False Discovery Rate Control in Correlated Detection Maps. EUSIPCO (2020)
Samuel Thé, Éric Thiébaut, Loïc Denis, Ferréol Soulez
Exploiting the scaling indetermination of bi-linear models in inverse problems. EUSIPCO (2020)
Olivier Flasseur, Loïc Denis, Éric Thiébaut, Thomas Olivier, Corinne Fournier
ExPACO: detection of an extended pattern under nonstationary correlated noise by patch covariance modeling. EUSIPCO (2019)
Olivier Flasseur, Loïc Denis, Éric Thiébaut, Maud Langlois
An Unsupervised Patch-Based Approach for Exoplanet Detection by Direct Imaging. ICIP (2018)
Olivier Flasseur, Loïc Denis, Corinne Fournier, Éric Thiébaut
Robust object characterization from lensless microscopy videos. EUSIPCO (2017)
Loïc Denis, André Ferrari, David Mary, Laurent M. Mugnier, Éric Thiébaut
Fast and robust detection of a known pattern in an image. EUSIPCO (2016)
Rahul Mourya, Loïc Denis, Jean-Marie Becker, Éric Thiébaut
Augmented Lagrangian without alternating directions: Practical algorithms for inverse problems in imaging. ICIP (2015)
Antony Schutz, André Ferrari, David Mary, Éric Thiébaut, Ferréol Soulez
Large scale 3D image reconstruction in optical interferometry. EUSIPCO (2015)
Rahul Mourya, Loïc Denis, Jean-Marie Becker, Éric Thiébaut
A blind deblurring and image decomposition approach for astronomical image restoration. EUSIPCO (2015)
Fabien Momey, Loïc Denis, Catherine Burnier, Éric Thiébaut, Jean-Marie Becker, Laurent Desbat
Spline Driven: High Accuracy Projectors for Tomographic Reconstruction From Few Projections. IEEE Trans. Image Process. 24 (12) (2015)
Loïc Denis, Éric Thiébaut, Ferréol Soulez, Jean-Marie Becker, Rahul Mourya
Fast Approximations of Shift-Variant Blur. Int. J. Comput. Vis. 115 (3) (2015)
Antony Schutz, André Ferrari, David Mary, Ferréol Soulez, Éric Thiébaut, Martin Vannier
PAINTER: a spatio-spectral image reconstruction algorithm for optical interferometry. CoRR (2014)
Louis Thibon, Ferréol Soulez, Éric Thiébaut
Fast automatic myopic deconvolution of angiogram sequences. ISBI (2014)
Viet-Dung Tran, Maxime Moreaud, Éric Thiébaut, Loïc Denis, Jean-Marie Becker
Robust registration of electron tomography projections without fiducial markers. Computational Imaging (2013)
Ferréol Soulez, Loïc Denis, Yves Tourneur, Éric Thiébaut
Blind deconvolution of 3D data in wide field fluorescence microscopy. ISBI (2012)
Éric Thiébaut, Ferréol Soulez, Loïc Denis
Exploiting spatial sparsity for multi-wavelength imaging in optical interferometry CoRR (2012)
Loïc Denis, Éric Thiébaut, Ferréol Soulez
Fast model of space-variant blurring and its application to deconvolution in astronomy. ICIP (2011)
Ferréol Soulez, Sébastien Bongard, Éric Thiébaut, Roland Bacon
Restoration of hyperspectral astronomical data from integral field spectrograph. WHISPERS (2011)
Éric Thiébaut, Jean-François Giovannelli
Image reconstruction in optical interferometry. IEEE Signal Process. Mag. 27 (1) (2010)
Sébastien Bongard, Éric Thiébaut, Ferréol Soulez, E. Pecontal
4D deconvolution and demixing for supernova follow-up. WHISPERS (2009)
Ferréol Soulez, Éric Thiébaut
Joint deconvolution and demosaicing. ICIP (2009)
Ferréol Soulez, Éric Thiébaut, Alain Gressard, Raphael Dauphin, Sébastien Bongard
Heterogeneous multidimensional data deblurring. EUSIPCO (2008)
Ferréol Soulez, Éric Thiébaut, Yves Tourneur, Alain Gressard, Raphael Dauphin
Blind deconvolution of video sequences. ICIP (2008)
Guy Le Besnerais, Sylvestre Lacour, Laurent M. Mugnier, Éric Thiébaut, Guy Perrin, Serge Meimon
Advanced Imaging Methods for Long-Baseline Optical Interferometry. IEEE J. Sel. Top. Signal Process. 2 (5) (2008)